Abstract: Methods and apparatus are provided for testing to determine the existence of defects and faults in circuits, devices, and systems such as digital integrated circuits, SRAM memory, mixed signal circuits, and the like. In particular, methods and apparatus are provided for detecting faults in circuits, devices, and systems using input control signals to generate controlled-duration, controlled pulse-width, transient power supply currents in a device under test, where said transient power supply currents are of controllable bandwidth and can be used as observables to determine faulty or defective operation. Additionally, methods and apparatus are provided to permit high bandwidth sensing of transient supply currents as need to preserve the narrow widths of these current pulses. These methods may include autozero techniques to remove supply current leakage current and DC offsets associated with practical current sensing currents.

Abstract: A proximity detection system for determining when a single channel receiver becomes proximate to any point on a wireless closed boundary continuously generated by a transmitter. The transmitter includes a magnetic field generator broadcasting a composite, modulated, time-varying magnetic field signal of a particular carrier frequency. The receiver forms a measure of the broadcast magnetic field intensity incident to the location of the receiver or a measure of the power or energy of incident field.

Abstract: Programs having multiple procedures are analyzed by creating a systThis invention was made with U.S. Government support awarded by the National Science Foundation (NSF), Grant #DCR-8603356 and PYI Award #DCR-8552602. The U.S. Government has certain rights in this invention.