Abstract: Systems and methods for testing semiconductor wafers using a wafer translator are disclosed herein. In one embodiment, an apparatus for testing semiconductor dies on a wafer includes a wafer translator having a wafer-side facing toward the wafer, and an inquiry-side facing away from the wafer-side. The wafer has an active side facing the translator. The apparatus includes a peripheral seal configured to seal a space between the wafer translator and the wafer, and a valve in a fluidic communication with the space between the wafer translator and the wafer.

Abstract: A roof rack that is configured with hinges and lifting shocks that allows the center basket to be lifted while still attached to the frame. Additionally, the roof rack can be used to mount lighting to the vehicle. Embodiments of the roof rack allow the roof of the vehicle to be accessed without removing the rack from the vehicle.