Abstract: Systems and methods are provided for determining a velocity or an inflation rate of a droplet in a microfluidic channel. The droplet is exposed to two or more temporally separated flashes of light, each flash including light of one wavelength band, and imaged using a detector configured to distinguish light in the wavelength bands. Two or more images of the droplet are acquired, each corresponding to one of the flashes, and all within a single video frame or photographic exposure. The images can be processed separately and the position or size of the droplet in each image is calculated. A velocity or inflation rate is then determined by dividing the change in position or size by the amount of time allowed to pass between the flashes.

Abstract: Systems and methods are provided for determining a velocity or an inflation rate of a droplet in a microfluidic channel. The droplet is exposed to two or more temporally separated flashes of light, each flash including light of one wavelength band, and imaged using a detector configured to distinguish light in the wavelength bands. Two or more images of the droplet are acquired, each corresponding to one of the flashes, and all within a single video frame or photographic exposure. The images can be processed separately and the position or size of the droplet in each image is calculated. A velocity or inflation rate is then determined by dividing the change in position or size by the amount of time allowed to pass between the flashes.

Abstract: The present invention generally pertains to a system, method and kit for the detection and measurement of spectroscopic properties of light from a sample, or the scalable detection and measurement of spectroscopic properties of light from each sample present among multiple samples, simultaneously, wherein the system comprises: an optical train comprising a dispersing element; and an image sensor. The light detected and measured may comprise light scattered from a sample, emitted as chemiluminescence by a chemical process within a sample, selectively absorbed by a sample, or emitted as fluorescence from a sample following excitation.

Abstract: A method of spectral measurement utilizing sensing devices that employ light or radiation sources. The method provides a uniform spectra or wavelength intensity reading with respect to the temperature or intensity by using an algorithm that incorporates the thermal aspects of the light or radiation source with the spectral, sensing or color attributes.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: Systems and methods are provided for determining a velocity or an inflation rate of a droplet in a microfluidic channel. The droplet is exposed to two or more temporally separated flashes of light, each flash including light of one wavelength band, and imaged using a detector configured to distinguish light in the wavelength bands. Two or more images of the droplet are acquired, each corresponding to one of the flashes, and all within a single video frame or photographic exposure. The images can be processed separately and the position or size of the droplet in each image is calculated. A velocity or inflation rate is then determined by dividing the change in position or size by the amount of time allowed to pass between the flashes.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: An apparatus for quantitation of surface-binding optical resonance profiles includes a calibration module including a calibration scan result fetcher, a calibration profile creation module, and a fitting module. The fitting module includes an experimental scan result fetcher, a calibration profile fetcher, and a resonance shift determination module. A method for qualifying a surface plasmon resonance chip is also described herein.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: A light source for an atomizing device, specifically an atom absorption spectrometer comprising one, two, or more lamps, whose ray can be selected by means of at least one two-dimensionally moveable optical selection element, and which can be directed in the direction of atomizing device. Fine-tuning is thereby achieved quickly with little constructive expenditure and with low costs. A very high degree of accuracy is possible from the selector through a rotational and highly adjustable rotation spindle.

Abstract: Empirical Profile Fits are used to quantitate Surface-binding Optical Resonance profiles. The EPF process has two stages, Calibration and Fit. In the Calibration stage, a calibration surface-binding optical resonance scan is obtained with relatively fine angle or wavelength spacing over a range sufficient to include full resonance profiles for all regions. Smoothed, subsampled empirical profiles for each Region of Interest are generated by the main calibration module, together with first derivative curves and diagnostic information. Properties returned may include approximate resonance position, depth, and width. In the Fit stage, individual ROI scans are used for measurement of resonance shifts relative to the empirical profile.

Abstract: Empirical profile curve fits (260) are used to quantitative the surface optical resonance profiles (268) using two EPF stages of calibration and fit. The calibration surface binding optical resonance scan is obtained with fine angle or wavelength spacing over a range including the full resonance profiles for all regions. The main calibration module (210) together with the first derivative curves and the diagnostic information generates each profile region of interest. The individual ROI scans are used for measurements of the resonance shifts relative to the empirical profile. In a preferred embodiment the instrument control and data acquisition software sets the internal parameters in the EPT calibration module and sends the raw data from a calibration scan to the EPF Calibration module which funnels the data through a sub sampler and a Savitsky-Golan smoothing routine before taking derivatives and characterizing the data to create the empirical profile for the chip (202).

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and the transfer function is applied to the test spectral line or spectrum in order to calculate a corrected test spectral line or spectrum.

Abstract: An array surface plasmon resonance (SPR) analysis instrument comprising a reflective SPR sensor array, a light source assembly arranged to project a collimated beam of light onto the reflective SPR sensor array to provide a reflected array image of the sensor array, and to scan the incident angle of the collimated beam of light over an angular range, and a detector assembly oriented to receive the reflected array image of the sensor array over the angular range, the detector assembly comprises a two-dimensional detector sensing element that is tilted with respect to the optical axis of the lens assembly in accordance with the Scheimpflug condition, and a lens assembly for focusing the reflected array image of said SPR sensor array onto said tilted detector sensing element.

Abstract: Systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: A method of increasing the spatial uniformity of the detected intensity of a beam of light from a laser in a system including the laser and a light detector. In one embodiment the method includes the steps of generating a beam of light with the laser; and moving the beam of light and the light detector relative to each other, such that the detector averages the spatial intensity of the beam of light over time. In another embodiment the invention relates to a system for increasing the detected spatial uniformity of the intensity of a beam of light. In one embodiment the system comprises a light detector; a laser source for generating the beam of light; and a means for moving the beam of light and the detector relative to one another such that the detector averages the intensity of the light beam over time.