Patents by Inventor David J. Gibson, Sr.

David J. Gibson, Sr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reversible test probe and test probe tip
    Patent number: 7902848
    Abstract: A reversible test probe and test probe tip. In one embodiment, a test probe tip is reversible relative to a test probe body. The reversible probe has a first probe tip at a first end and a second probe tip at a second end. The test probe body has an opening operable to receive the first probe tip and the second probe tip. When the first probe tip is positioned in the opening, the first probe tip is electrically coupled to a metal device in the test probe body. When the second probe tip is positioned in the opening, the second probe tip is electrically coupled to a metal device in the test probe body. In another embodiment, a test probe having two test probe tips is reversible relative to a test lead.
    Type: Grant
    Filed: January 9, 2009
    Date of Patent: March 8, 2011
    Assignee: Fluke Corporation
    Inventors: Larry Eccleston, Chris W. Lagerberg, John Renner, III, David J. Gibson, Sr.
  • REVERSIBLE TEST PROBE AND TEST PROBE TIP
    Publication number: 20100176828
    Abstract: A reversible test probe and test probe tip. In one embodiment, a test probe tip is reversible relative to a test probe body. The reversible probe has a first probe tip at a first end and a second probe tip at a second end. The test probe body has an opening operable to receive the first probe tip and the second probe tip. When the first probe tip is positioned in the opening, the first probe tip is electrically coupled to a metal device in the test probe body. When the second probe tip is positioned in the opening, the second probe tip is electrically coupled to a metal device in the test probe body. In another embodiment, a test probe having two test probe tips is reversible relative to a test lead.
    Type: Application
    Filed: January 9, 2009
    Publication date: July 15, 2010
    Applicant: Fluke Corporation
    Inventors: Larry Eccleston, Chris W. Lagerberg, John Renner, III, David J. Gibson, SR.
  • Power quality analyzer
    Patent number: D1006660
    Type: Grant
    Filed: March 4, 2021
    Date of Patent: December 5, 2023
    Assignee: Fluke Corporation
    Inventors: Ginger M. Woo, Scott M. Tsukamaki, David J. Gibson, Sr., Roger L. Howell
  • Power quality analyzer
    Patent number: D1029665
    Type: Grant
    Filed: October 9, 2023
    Date of Patent: June 4, 2024
    Assignee: Fluke Corporation
    Inventors: Ginger M. Woo, Scott M. Tsukamaki, David J. Gibson, Sr., Roger L. Howell