Patents by Inventor David K. McElfresh

David K. McElfresh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100023280
    Abstract: Some embodiments of the present invention provide a system that characterizes a response of a device in a computer system to vibration over a frequency range. During operation, the device is vibrated at each frequency in a set of frequencies in the frequency range, wherein the device is vibrated at each frequency, one frequency at a time, until a stabilized response of the device is determined. The response of the device to vibration over the frequency range is then characterized based on information related to the stabilized response at each frequency in the set of frequencies.
    Type: Application
    Filed: July 28, 2008
    Publication date: January 28, 2010
    Applicant: Sun Microsystems, Inc.
    Inventors: Dan Vacar, Anton A. Bougaev, David K. McElfresh, Kenny C. Gross
  • Publication number: 20100020438
    Abstract: Some embodiments of the present invention provide a system that includes a drive carrier for a hard disk drive (HDD) and one or more vibration control clips affixed to the drive carrier. Within this system, a mode of vibration of the HDD is modulated by contact between each of the vibration control clips and a surface within the computer system.
    Type: Application
    Filed: July 24, 2008
    Publication date: January 28, 2010
    Applicant: Sun Microsystem, Inc.
    Inventors: Kenny C. Gross, Anton Bougaev, Aleksey M. Urmanov, David K. McElfresh
  • Publication number: 20100004900
    Abstract: Embodiments of a mechanical device to facilitate in-situ measurements of vibration associated with a corresponding component in a computer system are described. This mechanical device includes a housing that has approximately a same mass as the component, approximately a same distribution of mass about a geometric center of the component, and approximately a same form factor as the component. Moreover, the mechanical device includes one or more vibration sensors, which are mechanically coupled to the housing, and which are configured to perform the in-situ vibration measurements.
    Type: Application
    Filed: July 3, 2008
    Publication date: January 7, 2010
    Applicant: Sun Microsystem, Inc.
    Inventors: Anton A. Bougaev, Aleksey M. Urmanov, David K. McElfresh, Kenny C. Gross
  • Publication number: 20100005237
    Abstract: Some embodiments of the present invention provide a system that schedules read operations for disk drives in a set of disk drives. During operation, the system monitors a write rate for write operations to a given disk drive in the set of disk drives, wherein vibrations generated by the read operations directed to disk drives in the set of disk drives are transmitted to the given disk drive. Then, the read operations for disk drives in the set of disk drives are scheduled based on the write rate for the given disk drive, thereby limiting interference between the write operations and the vibrations generated by the read operations.
    Type: Application
    Filed: July 3, 2008
    Publication date: January 7, 2010
    Applicant: SUN MICROSYSTEM, INC.
    Inventors: Anton A. Bougaev, David K. McElfresh, Aleksey M. Urmanov
  • Publication number: 20090326864
    Abstract: Some embodiments of the present invention provide a system that determines the reliability of an interconnect. During operation, connectors in the interconnect are categorized into a set of predetermined groups. Next, the reliability for selected groups in the set of predetermined groups is determined. Then, a reliability model for the interconnect is generated based on the selected groups and the reliability of the selected groups to determine the overall reliability of the interconnect.
    Type: Application
    Filed: June 27, 2008
    Publication date: December 31, 2009
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: David K. McElfresh, Dan Vacar, Leoncio D. Lopez, Kenny C. Gross
  • Publication number: 20090292490
    Abstract: One embodiment of the present invention provides a system that determines a total whisker length for conductive whiskers on a circuit in a computer system. During operation, a target electromagnetic signal radiating from the computer system is monitored. Then, the target electromagnetic signal is analyzed to determine the total whisker length for conductive whiskers on the circuit in the computer system.
    Type: Application
    Filed: May 23, 2008
    Publication date: November 26, 2009
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: David K. McElfresh, Kenny C. Gross, Ramakrishna C. Dhanekula
  • Publication number: 20090271145
    Abstract: Some embodiments of the present invention provide a system that determines a center of rotation for a component in a computer system. During operation, the system measures a first acceleration of a first location on the component and a second acceleration of a second location on the component, wherein the first location and the second location are separated by a predetermined distance. Then, the system determines the center of rotation using the first acceleration, the second acceleration, and the predetermined distance.
    Type: Application
    Filed: April 25, 2008
    Publication date: October 29, 2009
    Applicant: Sun Microsystems, Inc.
    Inventors: Anton A. Bougaev, David K. McElfresh, Kenny C. Gross, Aleksey M. Urmanov
  • Publication number: 20090230976
    Abstract: A test system including a package with interconnect paths. The package may have electrical paths that are electrically connected by the interconnect paths. The electrically connected electrical paths may yield increased data without significantly increasing the required testing hardware.
    Type: Application
    Filed: March 13, 2008
    Publication date: September 17, 2009
    Applicant: Sun Microsystems, Inc.
    Inventors: David K. McElfresh, Dan Vacar, Robert H. Melanson, Leoncio D. Lopez
  • Publication number: 20090230977
    Abstract: A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.
    Type: Application
    Filed: March 13, 2008
    Publication date: September 17, 2009
    Applicant: Sun Microsystems, Inc.
    Inventors: Dan Vacar, David K. McElfresh, Robert H. Melanson, Leoncio D. Lopez
  • Publication number: 20090234484
    Abstract: A system that detects multiple anomalies in a cluster of components is presented. During operation, the system monitors derivatives obtained from one or more inferential variables which are received from sensors in the cluster of components. The system then determines whether one or more components within the cluster have experienced an anomalous event based on the monitored derivatives. If so, the system performs one or more remedial actions.
    Type: Application
    Filed: March 14, 2008
    Publication date: September 17, 2009
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: Dan Vacar, David K. McElfresh, Kenny C. Gross, Leoncio D. Lopez
  • Publication number: 20090228237
    Abstract: A method for quantifying a shape of a surface comprising: measuring an elevation (z) of the surface at a plurality of locations in an x-y plane of the surface comprising measurement data; performing a fit of the measurement data to a series expansion in terms of one or more base functions comprising a series expansion fit; calculating a vector of shape coefficients from the series expansion fit; and outputting the vector of shape coefficients.
    Type: Application
    Filed: March 10, 2008
    Publication date: September 10, 2009
    Applicant: Sun Microsystems, Inc.
    Inventors: Dan VACAR, David K. McElfresh, Anton Bougaev, Donald A. Kearns, Charles E. Kinney
  • Patent number: 7577542
    Abstract: One embodiment of the present invention provides a system that dynamically adjusts data resolution during proactive-fault-monitoring in a computer system. During operation, the system temporarily stores high-resolution data for a telemetry signal from the computer system in a buffer. The system then generates low-resolution data for the telemetry signal from the high-resolution data. Next, the system monitors the low-resolution data, and while doing so, determines if an anomaly exists in the low-resolution data. If an anomaly exists in the low-resolution data, the system records the high-resolution data from the buffer on a storage device.
    Type: Grant
    Filed: April 11, 2007
    Date of Patent: August 18, 2009
    Assignee: Sun Microsystems, Inc.
    Inventors: Dan Vacar, David K. McElfresh, Kenny C. Gross
  • Publication number: 20090204839
    Abstract: A system that controls the temperature of a power supply in a computer system is presented. A state of the computer system is monitored. Next a signal is generated in response to the state of the computer system. The signal is then used to control the temperature of the power supply.
    Type: Application
    Filed: February 7, 2008
    Publication date: August 13, 2009
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: Kenny C. Gross, Aleksey M. Urmanov, David K. McElfresh
  • Publication number: 20090135514
    Abstract: Some embodiments of the present invention provide a system that includes a first hard disk drive (HDD) and a second HDD. Within this system, the first HDD is coupled to the second HDD in a non-parallel configuration, which reduces rotational vibration transmitted between the first HDD and the second HDD.
    Type: Application
    Filed: November 27, 2007
    Publication date: May 28, 2009
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: Ronald J. Melanson, David K. McElfresh, Anton A. Bougaev, Aleksey M. Urmanov, Kenneth C. Gross
  • Publication number: 20090125467
    Abstract: One embodiment of the present invention provides a system that proactively monitors and detects metal whisker growth in a target area within a computer system. During operation, the system collects target electromagnetic interference (EMI) signals using one or more antennas positioned in the vicinity of the target area. Next, the system analyzes the target EMI signals to proactively detect the onset of metal whisker growth in the target area.
    Type: Application
    Filed: November 13, 2007
    Publication date: May 14, 2009
    Applicant: Sun Microsystems, Inc.
    Inventors: Ramakrishna C. Dhanekula, Kenny C. Gross, David K. McElfresh
  • Patent number: 7466404
    Abstract: A method for testing a substrate by using a photoemission microscope is provided which includes providing the substrate and applying a reverse bias voltage to the substrate. The method further includes detecting light emissions from a top surface of the substrate and characterizing viability of the substrate from the detection of the light emissions.
    Type: Grant
    Filed: June 3, 2005
    Date of Patent: December 16, 2008
    Assignee: Sun Microsystems, Inc.
    Inventors: Dan Vacar, David K. McElfresh, Leoncio D. Lopez, Robert Melanson
  • Publication number: 20080252481
    Abstract: One embodiment of the present invention provides a system that dynamically adjusts data resolution during proactive-fault-monitoring in a computer system. During operation, the system temporarily stores high-resolution data for a telemetry signal from the computer system in a buffer. The system then generates low-resolution data for the telemetry signal from the high-resolution data. Next, the system monitors the low-resolution data, and while doing so, determines if an anomaly exists in the low-resolution data. If an anomaly exists in the low-resolution data, the system records the high-resolution data from the buffer on a storage device.
    Type: Application
    Filed: April 11, 2007
    Publication date: October 16, 2008
    Inventors: Dan Vacar, David K. McElfresh, Kenny C. Gross
  • Publication number: 20080252441
    Abstract: One embodiment of the present invention provides a system that performs a real-time root-cause-analysis for a degradation event associated with a component under test. During operation, the system monitors a telemetry signal collected from the component, and while doing so, attempts to detect an anomaly in the telemetry signal. If an anomaly is detected in the telemetry signal, the system performs a failure analysis on the telemetry signal in real-time while the telemetry signal is degrading. Next, the system identifies a failure mechanism for the component based on the failure analysis.
    Type: Application
    Filed: April 16, 2007
    Publication date: October 16, 2008
    Inventors: David K. McElfresh, Dan Vacar, Kenny C. Gross, Leoncio D. Lopez
  • Patent number: 7353431
    Abstract: A system that detects the onset of degradation for interconnections in a component within a computer system. During operation, the system monitors inferential variables associated with the interconnections during operation of the computer system. Next, the system determines a present state of the component from the monitored inferential variables. The system then compares the present state of the component with an initial state of the component. If the comparison indicates that the interconnections in the component have reached or will reach a limited operating state (LOS), the system performs a remedial action.
    Type: Grant
    Filed: August 21, 2006
    Date of Patent: April 1, 2008
    Assignee: Sun Microsystems, Inc.
    Inventors: Leoncio D. Lopez, David K. McElfresh, Dan Vacar, Kenny C. Gross
  • Publication number: 20080061812
    Abstract: Apparatus, systems, and methods are provided for testing the integrity of electrical interconnections in electronic systems. Apparatus may be constructed by modifying a substrate designed for deployment in an end-use product by shorting together multiple contacts on one side of it. Such vehicles may be used to test the characteristics of interconnections between the vehicle and its support, the shorted contacts enabling testing of individual interconnects under both DC and AC conditions. A system for testing the interconnects may include the modified substrate, an input signal generator, and an output signal monitor.
    Type: Application
    Filed: September 13, 2006
    Publication date: March 13, 2008
    Applicant: Sun Microsystems, Inc.
    Inventors: David K. McElfresh, Leoncio D. Lopez, Dan Vacar, Robert H. Melanson