Patents by Inventor David R. Trapp

David R. Trapp has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Low pass X-ray scintillator system
    Patent number: 7800072
    Abstract: A scintillated CCD detector system for imaging x rays uses x-rays having a photon energy in the range of 1 to 20 keV. The detector differs from existing systems in that it provides extremely high resolution of better than a micrometer, and high detection quantum efficiency of up to 95%. The design of this detector also allows it to function as an energy filter to remove high-energy x-rays. This detector is useful in a wide range of applications including x-ray imaging, spectroscopy, and diffraction. The scintillator optical system has scintillator material with a lens system for collecting the light that is generated in the scintillator material. A substrate is used for spacing the scintillator material from the lens system.
    Type: Grant
    Filed: April 6, 2006
    Date of Patent: September 21, 2010
    Assignee: Xradia, Inc.
    Inventors: Wenbing Yun, Yuxin Wang, David R. Trapp
  • High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
    Patent number: 7400704
    Abstract: A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
    Type: Grant
    Filed: October 2, 2006
    Date of Patent: July 15, 2008
    Assignee: Xradia, Inc.
    Inventors: Wenbing Yun, David Dean Scott, David R. Trapp, Frederick William Duewer, Yuxin Wang
  • Lens bonded X-ray scintillator system and manufacturing method therefor
    Patent number: 7297959
    Abstract: A scintillated CCD detector system for imaging x rays uses x-rays having a photon energy in the range of 1 to 20 keV. The detector differs from existing systems in that it provides extremely high resolution of better than a micrometer, and high detection quantum efficiency of up to 95%. The design of this detector also allows it to function as an energy filter to remove high-energy x-rays. This detector is useful in a wide range of applications including x-ray imaging, spectroscopy, and diffraction. The scintillator optical system has scintillator material with a lens system for collecting the light that is generated in the scintillator material. A substrate is used for spacing the scintillator material from the lens system.
    Type: Grant
    Filed: April 6, 2006
    Date of Patent: November 20, 2007
    Assignee: Xradia, Inc.
    Inventors: Wenbing Yun, Yuxin Wang, David R. Trapp
  • High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
    Patent number: 7130375
    Abstract: A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
    Type: Grant
    Filed: January 14, 2005
    Date of Patent: October 31, 2006
    Assignee: Xradia, Inc.
    Inventors: Wenbing Yun, David Dean Scott, David R. Trapp, Frederick William Duewer, Yuxin Wang
  • Scintillator optical system and method of manufacture
    Patent number: 7057187
    Abstract: A scintillated CCD detector system for imaging x rays uses x-rays having a photon energy in the range of 1 to 20 keV. The detector differs from existing systems in that it provides extremely high resolution of better than a micrometer, and high detection quantum efficiency of up to 95%. The design of this detector also allows it to function as an energy filter to remove high-energy x-rays. This detector is useful in a wide range of applications including x-ray imaging, spectroscopy, and diffraction. The scintillator optical system has scintillator material with a lens system for collecting the light that is generated in the scintillator material. A substrate is used for spacing the scintillator material from the lens system.
    Type: Grant
    Filed: November 7, 2003
    Date of Patent: June 6, 2006
    Assignee: Xradia, Inc.
    Inventors: Wenbing Yun, Yuxin Wang, David R. Trapp