Abstract: A compliant wafer prober docking adapter provide compliant docking capability which permits a test head to be floated (to come down) to the top portion of the compliant adapter. The compliant adapter includes a compliant spring mechanism in the form of coiled springs which support a portion of the weight of the test head and wherein the upper portion of the adapter automatically aligns itself with the test head. This desirable aspect allows for all of the connectors to be seated properly, such that the locking of a cam locking mechanism provides a compliant and secure mating between the two surfaces. Also, a test head can be easily moved from one wafer prober to another, because the alignment of the adapter to the wafer is not being disturbed.

Abstract: An electronic circuit tester for measuring the response of electrical signals applied to an electronic circuit under test is provided with a blind mate connector for effecting connection between a test head of the electronic circuit tester and a calibration board or, alternatively, a fixture board coupled to an electronic circuit under test. The blind mate connector includes a body portion having a relieved region at one end, a coaxial center conductor, dielectric material disposed in an interstitial region for supporting the center conductor within the body portion, a coaxial sleeve disposed in the relieved region in electrical contact with the body portion, and a ring to retain the sleeve in the body portion. The blind mate connector is mounted to the calibration or fixture board and mates with a compliant female connector incorporated into the test head.

Abstract: An electronic circuit test system for measuring the response to electrical signals applied to an electronic circuit under test is provided with a docking system for facilitating mechanical and electrical connections. A docking cone is mounted to a fixture board of the electronic circuit test system. The docking cone enters a tunnel in a test head of the electronic circuit test system as the fixture board is moved toward the test head. The docking cone guides connectors mounted to the fixture board into connection with mating connectors mounted to a load board and a connector support disk comprising the test head. The docking system increases the repeatability and reliability of mechanical and electrical connections and reduces the risk of damage to electrical connectors of the electronic circuit test system.

Abstract: A resistive film attenuator element comprised of a dielectric-mounted resistive film distributed ladder network having tuning stubs, combined in a coplanar structure, to provide a wide band attenuator having a substantially flat frequency response over a wide range of frequencies, for example, from D.C. to 40 GHz.