Abstract: This invention relates to an indexer for providing rotation of a part from a first index position to a second index position. The indexer comprises an indexer frame and a part for rotation. The indexer frame has at least one index feature, and the part has at least one index feature, wherein the at least one index feature on the indexer frame is co-operable with the at least one index feature on the part so as to provide two or more index positions of the part with respect to the indexer frame. In use the part locates with the indexer frame so as to form an axis about which the part is able to rotate relative to the indexer frame, the axis being kinematically located.

Abstract: Methods are described for calibrating a turning machine having a first rotatable portion or chuck for holding a workpiece. The first rotatable portion has a first feature associated therewith. The method comprises the steps of using a measurement probe to determine the position of the first feature, rotating the first rotatable portion through an angle, and using said measurement probe to determine the new position of the first feature. The extension of the technique to swivel head mill-turn machines is also described.

Abstract: Metrology apparatus is described that includes a first structure rotatably connected to a second structure by a bearing arrangement. The bearing arrangement includes at least a first friction bearing including parts in sliding contact during rotation of the first structure relative to the second structure. The apparatus includes at least one magnet that relieves the load on the first friction bearing. Multiple magnets, provided in an attracting or repelling arrangement, may be used. The metrology apparatus may include an articulating probe head for a coordinate positioning apparatus.

Abstract: A rotary gas bearing is described that comprises a first part rotatable relative to a second part. The first part comprises a support member and a first portion and a second portion attached to the support member. The first portion comprises a first bearing surface and the second portion comprising a second bearing surface. Both the first portion and the second portion are attached to the support member by screw thread connections. The second part may comprise complimentary bearing surfaces. Epoxy may be used to fix the first and/or second portions to the support member. A method of determining the bearing working gap by measuring gas flow through the bearing is also described.

Abstract: A rotation detection kit, comprising: a beam source; a receiver comprising at least one beam intensity sensor; a polarizer device for location in the path of a beam emitted from the beam source and received by the beam sensor; and a modulator. The modulator is configured to modulate at least one of i) the beam source and ii) a beam emitted by the beam source to create a discretely varying polarization orientation thereby defining first and at least second temporally spaced beam portions. The temporally spaced beam portions are incident on the polarizer device and the beam sensor and have substantially identical profiles and at least an initial common propagation axis toward the polarizer device.

Abstract: A metrology apparatus including a body and a first member rotatable relative to the body about a first axis of rotation, said first axis being defined by first bearing and a first motor for actuating rotation of the first member relative to the body about the first axis of rotation. A surface sensing device is attachable to the first member such that the surface sensing device can move with the first member, relative to the body. The first motor may include a first magnet and at least one metal coil spaced apart along the first axis and mounted such that the first magnet and the at least one metal coil are moveable relative to one another.

Abstract: A sample positioning stage for positioning a sample to be inspected relative to an optical inspection device. The stage includes a first generally planar body on which a sample to be inspected can be carried and a second body directly coupled to the first body via bearings extending between them which constrain movement of the first body relative to the second body to a first plane that is substantially parallel to the plane of the first body. There is also provided a drive system being selectively operable in a first mode and a second mode.

Abstract: Methods are described for calibrating a turning machine having a first rotatable portion or chuck for holding a workpiece. The first rotatable portion has a first feature associated therewith. The method comprises the steps of using a measurement probe to determine the position of the first feature, rotating the first rotatable portion through an angle, and using said measurement probe to determine the new position of the first feature. The extension of the technique to swivel head mill-turn machines is also described.

Abstract: A pivot joint has a first structure comprising a ball mounted in a receptacle, wherein the location of the ball is held with respect to the receptacle, and a second structure mounted on and movable with respect to the ball, wherein the second structure has at least one bearing surface which defines its position with respect to the ball. The ball may be held in location by contact with the receptacle at at least two positions. At least one of the positions of contact may be adjustable.

Abstract: A billet holder comprising a base and a frame is described. The base and frame are connectable, and when connected are relatively moveable between an open configuration when a billet may be inserted or removed from the billet holder and, a closed configuration when a billet is retained within the billet holder. A billet for being retained within a billet holder, said billet having one or more orientation feature, is also described. The billet may have essentially a D-shape. Further described is a method of manufacture of an article from a billet.

Abstract: A method of calibrating an articulating probe head comprising the steps of measuring an artefact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artefact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artefact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.

Abstract: A method of calibrating an articulating probe head comprising the steps of measuring an artefact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artefact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artefact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.

Abstract: A method and apparatus for controlling or programming a measurement path for a probe mounted on a coordinate positioning apparatus (e.g. an articulating probe head mounted on a CMM) which enables both the position of the probe tip and the orientation of the probe to be varied. In a first mode, the position of the probe tip is adjusted. In a second mode the orientation of the probe is adjusted, whilst keeping the location of the probe tip unchanged. This may be achieved either online on the coordinate positioning apparatus or offline in software.

Abstract: This invention relates to an indexer for providing rotation of a part from a first index position to a second index position. The indexer comprises an indexer frame and a part for rotation. The indexer frame has at least one index feature, and the part has at least one index feature, wherein the at least one index feature on the indexer frame is co-operable with the at least one index feature on the part so as to provide two or more index positions of the part with respect to the indexer frame. In use the part locates with the indexer frame so as to form an axis about which the part is able to rotate relative to the indexer frame, the axis being kinematically located.

Abstract: Position measurement apparatus, such as hexapod co-ordinate measuring machine, is described that comprises a thrust frame and a metrology frame. The thrust frame comprises a load carrying base connected to a moveable platform by a plurality of powered extendable legs. The metrology frame comprising a metrology base attached to the load carrying base by a base attachment mechanism such as kinematic mounts. The base attachment mechanism is arranged to prevent any distortions of the load carrying base being transmitted to the metrology base.

Abstract: A coordinate positioning apparatus has a base a structure and six struts joining the base and the structure. A working volume is defined by the base, structure and six struts. A support member extends from the supported structure. At least one access region is provided into the working volume, the access area being formed between two adjacent struts, the area of the access region being greater than the area between another set of adjacent struts. Access to the working volume is thereby improved.

Abstract: The invention provides a substrate treatment method and apparatus. Embodiments show a substrate in the form of a rotary encoder ring having a pattern of marks producable by means of a laser treatment device controllable to produce the pattern in the correct manner whilst there is continuous relative displacement between the ring and the laser treatment device.

Abstract: The invention provides a substrate treatment method and apparatus. Embodiments show a substrate in the form of a rotary encoder ring having a pattern of marks producable by means of a laser treatment device controllable to produce the pattern in the correct manner whilst there is continuous relative displacement between the ring and the laser treatment device.

Abstract: A sample positioning stage for positioning a sample to be inspected relative to an optical inspection device. The stage includes a first generally planar body on which a sample to be inspected can be carried and a second body directly coupled to the first body via bearings extending between them which constrain movement of the first body relative to the second body to a first plane that is substantially parallel to the plane of the first body. There is also provided a drive system being selectively operable in a first mode and a second mode.

Abstract: A coordinate positioning apparatus has a base a structure and six struts joining the base and the structure. A working volume is defined by the base, structure and six struts. A support member extends from the supported structure. At least one access region is provided into the working volume, the access area being formed between two adjacent struts, the area of the access region being greater than the area between another set of adjacent struts. Access to the working volume is thereby improved.