Patents by Inventor David S. Stoker

David S. Stoker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for conducting automated integrated circuit analysis
    Patent number: 10180402
    Abstract: A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.
    Type: Grant
    Filed: October 29, 2013
    Date of Patent: January 15, 2019
    Assignee: SRI International
    Inventors: David S. Stoker, Erik Frank Matlin, Motilal Agrawal, James R. Potthast, Neil William Troy
  • Dual magnification apparatus and system for examining a single objective in a scanning optical microscope using two wavelengths of light
    Patent number: 10139609
    Abstract: Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.
    Type: Grant
    Filed: July 20, 2018
    Date of Patent: November 27, 2018
    Assignee: The United States of America, as represented by the Secretary of the Navy
    Inventors: Brett J Hamilton, David S Stoker
  • Dual magnification apparatus and system for examining a single objective in a scanning optical microscope using two wavelengths of light
    Patent number: 10082657
    Abstract: Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: September 25, 2018
    Assignee: The United States of America, as represented by the Secretary of the Navy
    Inventors: Brett J Hamilton, David S Stoker
  • DUAL MAGNIFICATION APPARATUS AND SYSTEM FOR EXAMINING A SINGLE OBJECTIVE IN A SCANNING OPTICAL MICROSCOPE USING TWO WAVELENGTHS OF LIGHT
    Publication number: 20180052313
    Abstract: Dual magnification systems and apparatuses for testing and viewing a single objective in a scanning optical microscope and methods of using the systems and apparatuses are provided. Two optical paths allow two wavelengths of light to be magnified to separate magnification levels such that a lower magnification optical path can be used to examine a target area while a higher magnification optical path can be used to examine a subset of the target area and elicit test sample responses to localize a condition of interest.
    Type: Application
    Filed: June 15, 2017
    Publication date: February 22, 2018
    Inventors: Brett J. Hamilton, David S. Stoker
  • METHOD AND APPARATUS FOR CONDUCTING AUTOMATED INTEGRATED CIRCUIT ANALYSIS
    Publication number: 20140172345
    Abstract: A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.
    Type: Application
    Filed: October 29, 2013
    Publication date: June 19, 2014
    Applicant: SRI International
    Inventors: David S. Stoker, Erik Frank Matlin, Motilal Agrawal, James R. Potthast, Neil William Troy