Patents by Inventor David Stephane Christophe Boyer

David Stephane Christophe Boyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for photothermal imaging tiny metal particles immersed in a given medium
    Patent number: 6965434
    Abstract: A method and device for photothermal imaging tiny metal particles which are immersed in a given medium like a living cell. The given medium and immersed tiny metal particles are illuminated through separate phase reference laser beam and sensitive probe laser beam, with the sensitive probe laser beam undergoing through impingement on the given medium slight phase changes induced by photothermal effect due to a local heating thanks to a heating laser beam, in the absence of any substantial phase changes to the phase reference laser beam. Illuminating is performed by focusing the separate phase reference laser beam. The induced slight phase changes on the sensitive probe laser beam with reference to the phase reference laser beam are detected through differential phase interference contrast phenomenon so as to allow each of the tiny metal particles in the given medium to be imaged as an optical label.
    Type: Grant
    Filed: March 13, 2003
    Date of Patent: November 15, 2005
    Assignees: Centre National de la Recherche Scientifiques (C.N.R.S.), Universite de Bordeaux 1
    Inventors: Brahim Lounis, David Stephane Christophe Boyer, Philippe Tamarat, Abdelhamid Maali, Michel Alain Gaston Julien Orrit
  • Method and device for photothermal imaging tiny metal particles immersed in a given medium
    Publication number: 20040052292
    Abstract: A method and device for photothermal imaging tiny metal particles which are immersed in a given medium like a living cell. The given medium and immersed tiny metal particles are illuminated through separate phase reference laser beam and sensitive probe laser beam, with the sensitive probe laser beam undergoing through impingement on the given medium slight phase changes induced by photothermal effect due to a local heating thanks to a heating laser beam, in the absence of any substantial phase changes to the phase reference laser beam. Illuminating is performed by focusing the separate phase reference laser beam. The induced slight phase changes on the sensitive probe laser beam with reference to the phase reference laser beam are detected through differential phase interference contrast phenomenon so as to allow each of the tiny metal particles in the given medium to be imaged as an optical label.
    Type: Application
    Filed: March 13, 2003
    Publication date: March 18, 2004
    Inventors: Brahim Lounis, David Stephane Christophe Boyer, Philippe Tamarat, Abdelhamid Maali, Michel Alain Gaston Julien Orrit