Abstract: An example system includes a circuit board having electrical elements; a wafer having contacts; and an interconnect to route signals between the electrical elements and the contacts. The interconnect includes multiple layers, each of which includes a flexible circuit. The flexible circuit includes a conductive trace disposed thereon. The interconnect also includes shielding between adjacent layers of the multiple layers. The shielding is electrically connected to ground.

Abstract: A system includes: a circuit board including electrical elements arranged at a first pitch; a wafer including contacts arranged at a second pitch, where the second pitch is less than the first pitch; and an interconnect including additively-manufactured electrical conduits that are part of an electrical pathway between the electrical elements and the contacts, where the additively-manufactured electrical conduits include electrically-conductive material.

Abstract: An example system includes a circuit board having electrical elements; a wafer having contacts; and an interconnect to route signals between the electrical elements and the contacts. The interconnect includes multiple layers, each of which includes a flexible circuit. The flexible circuit includes a conductive trace disposed thereon. The interconnect also includes shielding between adjacent layers of the multiple layers. The shielding is electrically connected to ground.

Abstract: An example system for testing camera modules includes: a structure for holding camera modules under test, where each of the camera modules includes an image sensor, and where the camera modules are arranged in a same plane on the structure and offset from each other in the plane; and a target for use in testing the camera modules concurrently, where the target includes multiple tiles that are repeated, where each tile contains information for use in testing a camera module, and where the camera modules and the tiles are arranged so that different camera modules face different tiles but see at least some of the same information at the same angle.

Abstract: A system includes: a circuit board including electrical elements arranged at a first pitch; a wafer including contacts arranged at a second pitch, where the second pitch is less than the first pitch; and an interconnect including additively-manufactured electrical conduits that are part of an electrical pathway between the electrical elements and the contacts, where the additively-manufactured electrical conduits include electrically-conductive material.

Abstract: An example system for testing camera modules may include: a polygonal structure that is rotatable, where the polygonal structure includes faces, each of which is configured to receive at least one camera module under test; and targets facing at least some of the faces of the polygonal structure, where each target is usable in testing a corresponding camera module facing the each target.

Abstract: An example system for testing camera modules may include: a polygonal structure that is rotatable, where the polygonal structure includes faces, each of which is configured to receive at least one camera module under test; and targets facing at least some of the faces of the polygonal structure, where each target is usable in testing a corresponding camera module facing the each target.

Abstract: An example system for testing camera modules includes: a structure for holding camera modules under test, where each of the camera modules includes an image sensor, and where the camera modules are arranged in a same plane on the structure and offset from each other in the plane; and a target for use in testing the camera modules concurrently, where the target includes multiple tiles that are repeated, where each tile contains information for use in testing a camera module, and where the camera modules and the tiles are arranged so that different camera modules face different tiles but see at least some of the same information at the same angle.

Abstract: A system includes electronics for testing a device, a reservoir to store coolant, where the reservoir includes a bellows that is compressible, a pump system to move coolant out of the reservoir to cool the electronics, and means to compress the bellows and thereby pressurize the coolant stored in the reservoir so that the coolant remains substantially flush with an interface to the pump system.

Abstract: A system includes electronics for testing a device, a reservoir to store coolant, where the reservoir includes a bellows that is compressible, a pump system to move coolant out of the reservoir to cool the electronics, and means to compress the bellows and thereby pressurize the coolant stored in the reservoir so that the coolant remains substantially flush with an interface to the pump system.