Patents by Inventor Davor Juricic

Davor Juricic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method of multi-dimensional force sensing for scanning probe microscopy
    Patent number: 6666075
    Abstract: A scanning probe microscopy tool is provided with a force sensor that simultaneously measures more than one component of a surface force. The tool is comprised of an oscillator, a tip, a mechanical actuator, a sensing system, and a feedback control system. The oscillator has a selected shape, dimensions ratio, and /or material composition such that the oscillator comprises a first resonant mode for a first direction, wherein a first resonance of the first resonance mode can be altered by a surface force interaction between the tip and the sample in the first direction; and a second resonant mode for a second direction, wherein a second resonance of the second resonant mode can be altered by the surface force interaction between the tip and the sample in the second direction.
    Type: Grant
    Filed: June 13, 2001
    Date of Patent: December 23, 2003
    Assignee: Xidex Corporation
    Inventors: Vladimir Mancevski, Davor Juricic, Paul F. McClure
  • System and method of multi-dimensional force sensing for scanning probe microscopy
    Publication number: 20020121131
    Abstract: A SYSTEM AND METHOD OF MULTI-DIMENSIONAL FORCE SENSING FOR SCANNING PROBE MICROSCOPY is provided.
    Type: Application
    Filed: June 13, 2001
    Publication date: September 5, 2002
    Inventors: Vladimir Mancevski, Davor Juricic, Paul F. McClure