Patents by Inventor Dawn M. Skala

Dawn M. Skala has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8466207
    Abstract: Disclosed is a method for making a polyurethane closed-cell foam material exhibiting a bulk density below 4 lbs/ft3 and high strength. The present embodiment uses the reaction product of a modified MDI and a sucrose/glycerine based polyether polyol resin wherein a small measured quantity of the polyol resin is “pre-reacted” with a larger quantity of the isocyanate in a defined ratio such that when the necessary remaining quantity of the polyol resin is added to the “pre-reacted” resin together with a tertiary amine catalyst and water as a blowing agent, the polymerization proceeds slowly enough to provide a stable foam body.
    Type: Grant
    Filed: February 27, 2007
    Date of Patent: June 18, 2013
    Assignee: Sandia Corporation
    Inventors: Leroy L. Whinnery, Jr., Steven H. Goods, Dawn M. Skala, Craig C. Henderson, Patrick N. Keifer
  • Patent number: 7608367
    Abstract: The present invention is directed to the use of vitreous carbon as a substrate material for providing masks for X-ray lithography. The new substrate also enables a small thickness of the mask absorber used to pattern the resist, and this enables improved mask accuracy. An alternative embodiment comprised the use of vitreous carbon as a LIGA substrate wherein the VC wafer blank is etched in a reactive ion plasma after which an X-ray resist is bonded. This surface treatment provides a surface enabling good adhesion of the X-ray photoresist and subsequent nucleation and adhesion of the electrodeposited metal for LIGA mold-making while the VC substrate practically eliminates secondary radiation effects that lead to delamination of the X-ray resist form the substrate, the loss of isolated resist features, and the formation of a resist layer adjacent to the substrate that is insoluble in the developer.
    Type: Grant
    Filed: July 28, 2005
    Date of Patent: October 27, 2009
    Assignee: Sandia Corporation
    Inventors: Georg Aigeldinger, Dawn M. Skala, Stewart K. Griffiths, Albert Alec Talin, Matthew W. Losey, Chu-Yeu Peter Yang
  • Patent number: 6798862
    Abstract: The present invention describes a method for fabricating an x-ray mask tool which can achieve pattern features having lateral dimension of less than 1 micron. The process uses a thin photoresist and a standard lithographic mask to transfer an trace image pattern in the surface of a silicon wafer by exposing and developing the resist. The exposed portion of the silicon substrate is then anisotropically etched to provide an etched image of the trace image pattern consisting of a series of channels in the silicon having a high depth-to-width aspect ratio. These channels are then filled by depositing a metal such as gold to provide an inverse image of the trace image and thereby providing a robust x-ray mask tool.
    Type: Grant
    Filed: October 1, 2002
    Date of Patent: September 28, 2004
    Assignee: Sandia National Laboratories
    Inventors: Alfredo M. Morales, Dawn M. Skala
  • Publication number: 20040127590
    Abstract: Disclosed is a polyurethane closed-cell foam composition exhibiting an ability to absorb very high strain rate compression without loss of structural integrity by brittle fracture, spalling, or splintering. The new composition further exhibits no loss or degradation in conventional mechanical properties, particularly its response to low rate compression. The new formulation of the present embodiemnt is based on the reaction product of a modified MDI isocyanate and a sucrose/glycerine based polyether polyol resin catalyzed by a mixture of one or more tertiary amines and water wherein the isocyanate and polyol resin each have a low number of functional groups per monomer and a high number of rotational degrees of freedom.
    Type: Application
    Filed: December 20, 2002
    Publication date: July 1, 2004
    Inventors: Leroy Whinnery, Steven H. Goods, Dawn M. Skala, Craig C. Henderson
  • Publication number: 20030128803
    Abstract: The present invention describes a method for fabricating an x-ray mask tool which can achieve pattern features having lateral dimension of less than 1 micron. The process uses a thin photoresist and a standard lithographic mask to transfer an trace image pattern in the surface of a silicon wafer by exposing and developing the resist. The exposed portion of the silicon substrate is then anisotropically etched to provide an etched image of the trace image pattern consisting of a series of channels in the silicon having a high depth-to-width aspect ratio. These channels are then filled by depositing a metal such as gold to provide an inverse image of the trace image and thereby providing a robust x-ray mask tool.
    Type: Application
    Filed: October 1, 2002
    Publication date: July 10, 2003
    Inventors: Alfredo M. Morales, Dawn M. Skala
  • Patent number: 6477225
    Abstract: The present invention describes a method for fabricating an x-ray mask tool which can achieve pattern features having lateral dimension of less than 1 micron. The process uses a thin photoresist and a standard lithographic mask to transfer an trace image pattern in the surface of a silicon wafer by exposing and developing the resist. The exposed portion of the silicon substrate is then anisotropically etched to provide an etched image of the trace image pattern consisting of a series of channels in the silicon having a high depth-to-width aspect ratio. These channels are then filled by depositing a metal such as gold to provide an inverse image of the trace image and thereby providing a robust x-ray mask tool.
    Type: Grant
    Filed: August 9, 2000
    Date of Patent: November 5, 2002
    Assignee: Sandia National Laboratories
    Inventors: Alfredo M. Morales, Dawn M. Skala
  • Patent number: 6472459
    Abstract: A method is provided for fabricating metallic microstructures, i.e., microcomponents of micron or submicron dimensions. A molding composition is prepared containing an optional binder and nanometer size (1 to 1000 nm in diameter) metallic particles. A mold, such as a lithographically patterned mold, preferably a LIGA or a negative photoresist mold, is filled with the molding composition and compressed. The resulting microstructures are then removed from the mold and the resulting metallic microstructures so provided are then sintered.
    Type: Grant
    Filed: January 16, 2001
    Date of Patent: October 29, 2002
    Assignee: Sandia Corporation
    Inventors: Alfredo M. Morales, Michael R. Winter, Linda A. Domeier, Shawn M. Allan, Dawn M. Skala
  • Publication number: 20010038803
    Abstract: A method is provided for fabricating metallic microstructures, i.e., microcomponents of micron or submicron dimensions. A molding composition is prepared containing an optional binder and nanometer size (1 to 1000 nm in diameter) metallic particles. A mold, such as a lithographically patterned mold, preferably a LIGA or a negative photoresist mold, is filled with the molding composition and compressed. The resulting microstructures are then removed from the mold and the resulting metallic micro structures so provided are then sintered.
    Type: Application
    Filed: January 16, 2001
    Publication date: November 8, 2001
    Inventors: Alfredo M. Morales, Michael R. Winter, Linda A. Domeier, Shawn M. Allan, Dawn M. Skala