Abstract: Technology for inspection for detecting a defect of a printed matter using machine logic informed by machine learning. Some embodiments of the present invention may include one, or more, of the following features: (i) generates defect datasets; (ii) generates defect libraries; (iii) uses the generated defect libraries for deep learning training; and (iv) uses machine learning to detect defects using computer code (for example, a *.jpg format file) corresponding to an image of a piece of printed matter instead of using a visual image (that is, an image of the type that is created when a person takes a picture using a traditional film camera).

Abstract: Technology for inspection for detecting a defect of a printed matter using machine logic informed by machine learning. Some embodiments of the present invention may include one, or more, of the following features: (i) generates defect datasets; (ii) generates defect libraries; (iii) uses the generated defect libraries for deep learning training; and (iv) uses machine learning to detect defects using computer code (for example, a *.jpg format file) corresponding to an image of a piece of printed matter instead of using a visual image (that is, an image of the type that is created when a person takes a picture using a traditional film camera).