Patents by Inventor Dean M. Shough

Dean M. Shough has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5612786
    Abstract: A method for measuring the contours (30) of a three-dimensional object (4); and a method for calibrating an optical system (2, 8). The object (4) is placed into the field of view of the optical system (2, 8). The optical system (2, 8) is activated to obtain a set of data giving a phase (x.sub.t) at each of a plurality of pixels corresponding to the object (4). The phases (x.sub.t) are unwrapped, e.g., by a method of ordered phase unwrapping. The unwrapped phases are converted into a set of three-dimensional coordinates (x.sub.s, y.sub.s, z.sub.s) of the object (4) for each of the pixels. These coordinates (x.sub.s, y.sub.s, z.sub.s) can be portrayed on a display of a computer (10). The method for calibrating the optical system (2, 8) shares several common steps with the above method. In addition, coordinates of a test calibration fixture (38, 46) are first mechanically measured.
    Type: Grant
    Filed: December 8, 1995
    Date of Patent: March 18, 1997
    Assignee: Lockheed Missiles & Space Company, Inc.
    Inventors: Edward D. Huber, Rick A. Williams, Dean M. Shough, Osuk Y. Kwon, Rebecca L. Welling
  • Patent number: 5557410
    Abstract: A method for measuring the contours (30) of a three-dimensional object (4); and a method for calibrating an optical system (2, 8). The object (4) is placed into the field of view of the optical system (2, 8). The optical system (2, 8) is activated to obtain a set of data giving a phase (x.sub.t) at each of a plurality of pixels corresponding to the object (4). The phases (x.sub.t) are unwrapped, e.g., by a method of ordered phase unwrapping. The unwrapped phases are converted into a set of three-dimensional coordinates (x.sub.s, y.sub.s, z.sub.s) of the object (4) for each of the pixels. These coordinates (x.sub.s, y.sub.s, z.sub.s) can be portrayed on a display of a computer (10). The method for calibrating the optical system (2, 8) shares several common steps with the above method. In addition, coordinates of a test calibration fixture (38, 46) are first mechanically measured.
    Type: Grant
    Filed: June 6, 1995
    Date of Patent: September 17, 1996
    Assignee: Lockheed Missiles & Space Company, Inc.
    Inventors: Edward D. Huber, Rick A. Williams, Dean M. Shough, Osuk Y. Kwon, Rebecca L. Welling
  • Patent number: 5471345
    Abstract: Wavefront correction apparatus for correcting a stepped wavefront output produced by certain angles of scan and by certain positions of scan in scanning microlens arrays includes anamorphic transfer optics with diffractive corrections. The transfer optics form the outputs of all of the unit cell trains of the microlens arrays into a unique, separate, linear image at each position of scan of the scanning array. A stepped wavefront corrector is positioned in the path of each linear image, and selected thicknesses of the material in the stepped wavefront corrector are effective to vary the times of optical passage through the stepped wavefront corrector in amounts to restore the wavefront to a continuous, unstepped form at the outlet of the plate.
    Type: Grant
    Filed: July 7, 1994
    Date of Patent: November 28, 1995
    Assignee: Lockheed Missiles & Space Company, Inc.
    Inventors: George Gal, William W. Anderson, Bruce J. Herman, Dean M. Shough
  • Patent number: 5450241
    Abstract: Wavefront correction apparatus for correcting a stepped wavefront output produced by certain angles of scan and by certain positions of scan in scanning microlens arrays includes anamorphic transfer optics with diffractive corrections. The transfer optics form the outputs of all of the unit cell trains of the microlens arrays into a unique, separate, linear image at each position of scan of the scanning array. A stepped wavefront corrector is positioned in the path of each linear image, and selected thicknesses of the material in the stepped wavefront corrector are effective to vary the times of optical passage through the stepped wavefront corrector in amounts to restore the wavefront to a continuous, unstepped form at the outlet of the plate.
    Type: Grant
    Filed: July 7, 1994
    Date of Patent: September 12, 1995
    Assignee: Lockheed Missiles & Space Co., Inc.
    Inventors: George Gal, William W. Anderson, Bruce J. Herman, Dean M. Shough
  • Patent number: 5444572
    Abstract: Wavefront correction apparatus for correcting a stepped wavefront output produced by certain angles of scan and by certain positions of scan in scanning microlens arrays includes anamorphic transfer optics with diffractive corrections. The transfer optics form the outputs of all of the unit cell trains of the microlens arrays into a unique, separate, linear image at each position of scan of the scanning array. A stepped wavefront corrector is positioned in the path of each linear image, and selected thicknesses of the material in the stepped wavefront corrector are effective to vary the times of optical passage through the stepped wavefront corrector in amounts to restore the wavefront to a continuous, unstepped form at the outlet of the plate.
    Type: Grant
    Filed: May 20, 1993
    Date of Patent: August 22, 1995
    Assignee: Lockheed Missiles & Space Company, Inc.
    Inventors: George Gal, William W. Anderson, Bruce J. Herman, Dean M. Shough