Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt % and less than 0.4 wt %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt % and less than 0.4 wt %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt. % and less than 0.4 wt. %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt. % and less than 0.4 wt. %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt. % and less than 0.4 wt. %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt. % and less than 0.4 wt. %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt. % and less than 0.4 wt. %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: Isopipes for use in making sheet glass by a fusion process are provided which exhibit reduced sag. The isopipes are composed of a zircon refractory which has a mean creep rate (MCR) at 1180° C. and 250 psi and a 95 percent confidence band (CB) for said mean creep rate such that the CB to MCR ratio is less than 0.5, the MCR and the CB both being determined using a power law model. The zircon refractory can contain titania (TiO2) at a concentration greater than 0.2 wt. % and less than 0.4 wt. %. A concentration of titania in this range causes the zircon refractory to exhibit a lower mean creep rate than zircon refractories previously used to make isopipes. In addition, the variation in mean creep rate is also reduced which reduces the chances that the zircon refractory of a particular isopipe will have an abnormally high creep rate and thus exhibit unacceptable sag prematurely.

Abstract: A flat panel display comprising an aluminosilicate glass panel that exhibits a strain point higher than 640.degree. C., a weight loss less than 20 mg/cm.sup.2 after immersion for 24 hours in an aqueous 5% by weight HCl solution at 95.degree. C., a CTE in the range of 31-57.times.10.sup.-7 /.degree. C., is nominally free of alkali metal oxides and has a composition consisting essentially of, as calculated in percent by weight on an oxide basis, 49-67% SiO.sub.2, at least 6% Al.sub.2 O.sub.3, the Al.sub.2 O.sub.3 being 6-14% in conjunction with 55-67% SiO.sub.2 and 16-23% in conjunction with 49-58% SiO.sub.2, SiO.sub.2 +Al.sub.2 O.sub.3 >68%, 0-15% B.sub.2 O.sub.3, at least one alkaline earth metal oxide selected from the group consisting of, in the proportions indicated, 0-21% BaO, 0-15% SrO, 0-18% CaO, 0-8% MgO and 12-30% BaO+CaO+SrO+MgO.

Abstract: A barium aluminosilicate glass for production of a panel in an LCD device and a method of producing the panel. The glass consists essentially of, as calculated in percent by weight on an oxide basis, 50-65% SiO.sub.2, at least 8% Al.sub.2 O.sub.3, the Al.sub.2 O.sub.3 being 8-13% in conjunction with 55-65% SiO.sub.2 and 18-22% in conjunction with 50-55% SiO.sub.2, SiO.sub.2 +Al.sub.2 O.sub.3 >68%, 0-8% B.sub.2 O.sub.3, 2-21% BaO, 0-13% SrO, 0-18% CaO, 0-6% MgO and 13-30% BaO+CaO+SrO+MgO.

Abstract: A flat panel display comprising an aluminosilicate glass panel that exhibits a strain point higher than 640° C., a weight loss less than 20 mg/cm2 after immersion for 24 hours in an aqueous 5% by weight HCl solution at 95° C., a CTE in the range of 31-57×10−7/° C., is nominally free of alkali metal oxides and has a composition consisting essentially of, as calculated in percent by weight on an oxide basis, 49-67% SiO2, at least 6% Al2O3, the Al2O3 being 6-14% in conjunction with 55-67% SiO2 and 16-23% in conjunction with 49-58% SiO2, SiO2+Al2O3>68%, 0-15% B2O3, at least one alkaline earth metal oxide selected from the group consisting of, in the proportions indicated, 0-21% BaO, 0-15% SrO, 0-18% CaO, 0-8% MgO and 12-30% BaO+CaO+SrO+MgO.