Patents by Inventor Dennis Petrich

Dennis Petrich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for analyzing measurements
    Publication number: 20050027477
    Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
    Type: Application
    Filed: August 25, 2004
    Publication date: February 3, 2005
    Applicant: Wavecrest Corporation
    Inventors: Peng Li, Ross Jessen, Jan Wilstrup, Dennis Petrich
  • Method and apparatus for analyzing measurements
    Patent number: 6799144
    Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
    Type: Grant
    Filed: June 27, 2001
    Date of Patent: September 28, 2004
    Assignee: Wavecrest Corporation
    Inventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich
  • Method and apparatus for analyzing measurements
    Publication number: 20010044704
    Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
    Type: Application
    Filed: June 27, 2001
    Publication date: November 22, 2001
    Applicant: Wavecrest Corporation
    Inventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich
  • Method and apparatus for analyzing measurements
    Patent number: 6298315
    Abstract: A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
    Type: Grant
    Filed: December 11, 1998
    Date of Patent: October 2, 2001
    Assignee: Wavecrest Corporation
    Inventors: Peng Li, Ross Adam Jessen, Jan Brian Wilstrup, Dennis Petrich