Abstract: Systems, methods, and devices are disclosed for inspecting a manufacturing component. Devices include a centering device configured to modify a position of an ultrasonic probe assembly relative to a manufacturing component to bisect an angle associated with the manufacturing component. Devices may also include a surface sensing device configured to sense a curvature associated with the manufacturing component. Devices may further include a plurality of sensors configured to measure a first displacement value associated with the centering device and a second displacement value associated with the surface sensing device. The devices may include a control circuit configured to determine a position adjustment value based on at least one of the first displacement value and the second displacement value. The devices may also include an actuator configured to modify a position of an ultrasonic transducer based, at least in part, on the position adjustment value.

Abstract: Systems, methods, and devices are disclosed for inspecting a manufacturing component. Devices include a centering device configured to modify a position of an ultrasonic probe assembly relative to a manufacturing component to bisect an angle associated with the manufacturing component. Devices may also include a surface sensing device configured to sense a curvature associated with the manufacturing component. Devices may further include a plurality of sensors configured to measure a first displacement value associated with the centering device and a second displacement value associated with the surface sensing device. The devices may include a control circuit configured to determine a position adjustment value based on at least one of the first displacement value and the second displacement value. The devices may also include an actuator configured to modify a position of an ultrasonic transducer based, at least in part, on the position adjustment value.

Abstract: A hat stringer inspection device permits continuous inspection of hat stringers as one or more probes are moved along the length of the hat stringer. Probes may be magnetically coupled to opposing surfaces of the structure, including, for example, where one of the probes is positioned inside the hat stringer and the probes are magnetically coupled across the surface of the hat stringer. The device may be autonomous with a feedback-controlled motor to drive the inspection device along the hat stringer. Magnetic coupling is also used to re-orient the position and/or alignment of the probes with respect to changes in the hat stringer or shapes, sizes, and configurations of hat stingers.

Abstract: Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder, which is configured to support one or more curved linear inspection sensors and may be constructed from rapid prototyping, such as stereolithography. Integrated curved linear ultrasonic transducer inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices and inspecting otherwise difficult-to-inspect curved radius features of structures, such as a corner of a hat stringer.

Abstract: Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder constructed from rapid prototyping, such as stereolithography, and which is configured to support one or more linear inspection sensors. Rapid prototype integrated linear ultrasonic transducer inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices.

Abstract: Apparatus, systems, and methods for inspecting a structure are provided which use a sensor holder constructed from rapid prototyping, such as stereolithography, and which is configured to support a plurality of inspection sensors typically arranged in an ordered matrix array and possibly with one or more additional inspection sensors aligned for inspection of difficult to inspect features of a structure such as radius corner or edge features. Rapid prototype integrated matrix array inspection apparatus, systems, and methods provide fast and efficient methods of constructing custom inspection devices.

Abstract: A hat stringer inspection device permits continuous inspection of hat stringers as one or more probes are moved along the length of the hat stringer. Probes may be magnetically coupled to opposing surfaces of the structure, including, for example, where one of the probes is positioned inside the hat stringer and the probes are magnetically coupled across the surface of the hat stringer. The device may be autonomous with a feedback-controlled motor to drive the inspection device along the hat stringer. Magnetic coupling is also used to re-orient the position and/or alignment of the probes with respect to changes in the hat stringer or shapes, sizes, and configurations of hat stingers.

Abstract: A method and apparatus are disclosed for a remnant of backing paper in parts fabricated from a sheet material. The apparatus includes: a backing paper for laminating to a sheet material; and a pattern printed on the backing paper for radiating a detection signal from the pattern through the sheet material in response to receiving an activation signal.

Abstract: A method, system, and computer program product for measuring runout of a rotating tool are provided. A rotating tool is illuminated with a coherent electromagnetic radiation. The tool has an axis and a reflective surface, and completes a rotation in one period. The surface has a radial displacement from the axis of the rotating tool. A path, of coherent electromagnetic radiation reflected from the reflective surface is sensed. A maximum radial displacement is determined based upon the sensed path and a minimum radial displacement is determined based upon the sensed path. A runout is determined based upon the difference between the maximum radial displacement and the minimum radial displacement. A tool edge margin can be measured by analysis of specific areas of the rotating tool.