Patents by Inventor Dietmar DONITZ

Dietmar DONITZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8901510
    Abstract: A particle beam device has a first column with a first beam axis, the first column having a first particle beam generator and a first objective lens for focusing the first particle beam on an object. A second column with a second beam axis is provided, the second column having a second particle beam generator and a second objective lens for focusing the second particle beam on the object. A detector, having a detection axis, detects interacting particles and/or radiation. The first beam axis and the second beam axis define a first angle, different from 0° and from 180°. The first and second beam axes are situated in a first plane. The detection axis of the detector and the first beam axis are situated in a second plane. The first plane and the second plane define a second angle having an absolute value in the range of 65° to 80°.
    Type: Grant
    Filed: March 27, 2012
    Date of Patent: December 2, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Dietmar Dönitz, Christian Wagner
  • Patent number: 8502142
    Abstract: A device and method for analyzing a sample provide for extracting a part to be analyzed from the sample with the aid of a previously generated opening in the sample. The part to be analyzed is examined in greater detail with the aid of a particle beam. For this purpose, the sample is placed in the opening or on a sample holder.
    Type: Grant
    Filed: September 15, 2009
    Date of Patent: August 6, 2013
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Ulrike Zeile, Dietmar Donitz
  • Publication number: 20120286159
    Abstract: A particle beam device has a first column with a first beam axis, the first column having a first particle beam generator and a first objective lens for focusing the first particle beam on an object. A second column with a second beam axis is provided, the second column having a second particle beam generator and a second objective lens for focusing the second particle beam on the object. A detector, having a detection axis, detects interacting particles and/or radiation. The first beam axis and the second beam axis define a first angle, different from 0° and from 180°. The first and second beam axes are situated in a first plane. The detection axis of the detector and the first beam axis are situated in a second plane. The first plane and the second plane define a second angle having an absolute value in the range of 65° to 80°.
    Type: Application
    Filed: March 27, 2012
    Publication date: November 15, 2012
    Inventors: Dietmar DÖNITZ, Christian WAGNER
  • Patent number: 8283641
    Abstract: A positioning device and a particle beam apparatus including a positioning device ensure reliable positioning of a holder for holding an object at any working distance. The positioning device includes a positionable holder for holding the object. A light source generates a light beam which is guided in the direction of the positionable holder. A detector detects the light beam. An injection area injects particles of a particle beam such that they are guided in the direction of the positionable holder. The light beam passes the injection area. The injection area has an output side for the light beam and the particle beam, which is directed toward the holder. The detector includes a detector element situated in an area between the output side and the holder. The light source includes a light source element situated in an area which extends away from the holder, starting from the output side.
    Type: Grant
    Filed: May 14, 2009
    Date of Patent: October 9, 2012
    Assignee: Carl Zeiss NTS GmbH
    Inventors: Dietmar Dönitz, Dirk Preixszas, Michael Steigerwald
  • Publication number: 20100133432
    Abstract: A device and method for analyzing a sample provide for extracting a part to be analyzed from the sample with the aid of a previously generated opening in the sample. The part to be analyzed is examined in greater detail with the aid of a particle beam. For this purpose, the sample is placed in the opening or on a sample holder.
    Type: Application
    Filed: September 15, 2009
    Publication date: June 3, 2010
    Inventors: Ulrike Zeile, Dietmar Donitz
  • Publication number: 20100044566
    Abstract: A positioning device and a particle beam apparatus including a positioning device ensure reliable positioning of a holder for holding an object at any working distance. The positioning device includes a positionable holder for holding the object. A light source generates a light beam which is guided in the direction of the positionable holder. A detector detects the light beam. An injection area injects particles of a particle beam such that they are guided in the direction of the positionable holder. The light beam passes the injection area. The injection area has an output side for the light beam and the particle beam, which is directed toward the holder. The detector includes a detector element situated in an area between the output side and the holder. The light source includes a light source element situated in an area which extends away from the holder, starting from the output side.
    Type: Application
    Filed: May 14, 2009
    Publication date: February 25, 2010
    Inventors: Dietmar DONITZ, Dirk PREIKSZAS, Michael STEIGERWALD