Patents by Inventor Dinesh Rao

Dinesh Rao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9378111
    Abstract: A method and system for correlating, for at least one managed system, at least one monitored computer metric and a plurality of associated alerts, comprising selecting a monitored computer metric designated by a user, selecting a time scale designated by the user; and selecting a number of alerts associated with the monitored computer metric, the alert being designated by the user. The monitored computer metric and the number of alerts are correlated over the selected time period, and a graph of the correlated monitored computer metric superimposed with a number of alerts over the selected time period is transmitted for presentation to the user. The user can select various monitored computer metrics, various alerts and various time periods.
    Type: Grant
    Filed: November 11, 2010
    Date of Patent: June 28, 2016
    Assignee: SAP SE
    Inventors: KrishnaKumar Ramesh Coimbatore, Dinesh Rao
  • Patent number: 9135135
    Abstract: Automatically setting a new threshold for a computer metric by detecting a first threshold for the computer metric, continuously taking measurements of the value of the computer metric at a predetermined rate, calculating the average of the measurements of the value of the computer metric over a predetermined time period, and calculating a second threshold for the computer metric based on the average of the values of the measurements. Calculating the second threshold may comprise establishing a base value for the threshold, establishing a maximum deviation of the threshold, and determining the average of the value of the measurements with respect to the base value and the maximum deviation.
    Type: Grant
    Filed: June 28, 2012
    Date of Patent: September 15, 2015
    Assignee: SAP SE
    Inventors: Dinesh Rao, Seshadri Chatterjee
  • Publication number: 20140005979
    Abstract: Automatically setting a new threshold for a computer metric by detecting a first threshold for the computer metric, continuously taking measurements of the value of the computer metric at a predetermined rate, calculating the average of the measurements of the value of the computer metric over a predetermined time period, and calculating a second threshold for the computer metric based on the average of the values of the measurements. Calculating the second threshold may comprise establishing a base value for the threshold, establishing a maximum deviation of the threshold, and determining the average of the value of the measurements with respect to the base value and the maximum deviation.
    Type: Application
    Filed: June 28, 2012
    Publication date: January 2, 2014
    Applicant: SAP AG
    Inventors: Dinesh Rao, Seshadri Chatterjee
  • Publication number: 20120151352
    Abstract: Various embodiments of systems and methods for rendering system components on a monitoring tool are described herein. A method includes receiving a user selection of a system from a list of monitorable systems, retrieving a plurality of components of the system selected by the user, and generating a graphical display illustrating the plurality of components in a hierarchical topology. Each component is being represented by a graphical indicator. The graphical indicator displays critical information or problem(s) related to a component that can be instantly perceived by the user. Further, the hierarchical topology illustrating a relationship (connectivity) between the components enables the user to easily track a root cause of the problem related to the component.
    Type: Application
    Filed: December 9, 2010
    Publication date: June 14, 2012
    Inventors: RAMPRASAD S., Srilatha M., Dinesh Rao, Suhas S., Raina Saboo, M. Sireesha
  • Publication number: 20120151396
    Abstract: Various embodiments of systems and methods for rendering an optimized metrics topology on a monitoring tool are described herein. A monitoring tool, installed on a computer, displays a list of monitorable systems and a plurality of components of a system selected from the list. Each component is analyzed under a selected category. Each component includes a set of metrics associated with the selected category. Each metric from the set of metrics for a component is ranked. A rank for each metric is determined based upon at least a navigation behavior of a user of the monitoring tool and a metric characteristic. Based upon their ranks, the metrics are arranged in an optimized metrics topology. Higher ranked metrics are arranged in relatively higher topology level thereby delivering critical or key metrics, up front, in which the user is interested in.
    Type: Application
    Filed: December 9, 2010
    Publication date: June 14, 2012
    Inventors: RAMPRASAD S., Raghavendra D., Chirag Goradia, Vishwas Jamadagni, Dinesh Rao, Suhas S.
  • Publication number: 20120124503
    Abstract: A method and system for correlating, for at least one managed system, at least one monitored computer metric and a plurality of associated alerts, comprising selecting a monitored computer metric designated by a user, selecting a time scale designated by the user; and selecting a number of alerts associated with the monitored computer metric, the alert being designated by the user. The monitored computer metric and the number of alerts are correlated over the selected time period, and a graph of the correlated monitored computer metric superimposed with a number of alerts over the selected time period is transmitted for presentation to the user. The user can select various monitored computer metrics, various alerts and various time periods.
    Type: Application
    Filed: November 11, 2010
    Publication date: May 17, 2012
    Applicant: SAP AG
    Inventors: KrishnaKumar Ramesh Coimbatore, Dinesh Rao
  • Patent number: 7429450
    Abstract: The present invention relates to compositions and methods for cancer diagnostics and therapeutics, including but not limited to, HIP1 cancer markers. In particular, the present invention provides compositions and methods of using HIP1 in the diagnosis and treatment of epithelial cancers. The present invention thus provides improved compositions and methods for diagnosing and treating some of the most common cancers (e.g., prostate and colon cancers). The present invention additionally provides drugs active against HIP1 and methods for screening for such drugs.
    Type: Grant
    Filed: December 6, 2001
    Date of Patent: September 30, 2008
    Assignee: The Regents of the University of Michigan
    Inventors: Theodora Ross, Ikuko Mizukami, Dinesh Rao
  • Publication number: 20030124533
    Abstract: The present invention relates to compositions and methods for cancer diagnostics and therapeutics, including but not limited to, HIP1 cancer markers. In particular, the present invention provides compositions and methods of using HIP1 in the diagnosis and treatment of epithelial cancers. The present invention thus provides improved compositions and methods for diagnosing and treating some of the most common cancers (e.g., prostate and colon cancers). The present invention additionally provides drugs active against HIP1 and methods for screening for such drugs.
    Type: Application
    Filed: December 6, 2001
    Publication date: July 3, 2003
    Inventors: Theodora Ross, Ikuko Mizukami, Dinesh Rao