Patents by Inventor Dinko E. Gonzalez Trotter

Dinko E. Gonzalez Trotter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for estimating a material composition of an imaged object
    Patent number: 6674835
    Abstract: A method for estimating a material composition of an imaged object using an imaging system. The imaging system includes a radiation source and a digital detector. The method also includes scanning a plurality of calibration phantoms with varying material composition to acquire a plurality of reference calibration images, estimating an attenuation coefficient thickness product for each pixel in the reference calibration images, and estimating a material composition of a region of interest using the estimated pixelwise coefficient thickness product.
    Type: Grant
    Filed: October 12, 2001
    Date of Patent: January 6, 2004
    Assignee: General Electric Co.
    Inventors: John Patrick Kaufhold, Jeffrey Wayne Eberhard, Dinko E. Gonzalez Trotter, Bernhard Erich Hermann Claus, John Eric Tkaczyk
  • Method and apparatus for calibrating an imaging system
    Patent number: 6632020
    Abstract: A method for calibration of an imaging system includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector. The method also includes imaging the calibration phantom system to obtain phantom images, processing the phantom images, and extracting a plurality of calibration values from the processed phantom images.
    Type: Grant
    Filed: October 12, 2001
    Date of Patent: October 14, 2003
    Assignee: General Electric Company
    Inventors: John Patrick Kaufhold, John Eric Tkaczyk, Dinko E. Gonzalez Trotter, Jeffrey Wayne Eberhard, Jerry A. Thomas
  • Methods and apparatus for correcting scatter
    Patent number: 6633626
    Abstract: A method for removing scatter in an image includes acquiring data of an object of interest, and using an iterative equation including a thickness-dependent kernel modulation factor to reconstruct an image of the object.
    Type: Grant
    Filed: February 1, 2002
    Date of Patent: October 14, 2003
    Assignee: General Electric Company
    Inventors: Dinko E. Gonzalez Trotter, Bernhard Erich Hermann Claus, Serge Louis Wilfrid Muller
  • METHODS AND APPARATUS FOR CORRECTING SCATTER
    Publication number: 20030147491
    Abstract: A method for removing scatter in an image includes acquiring data of an object of interest, and using an iterative equation including a thickness-dependent kernel modulation factor to reconstruct an image of the object.
    Type: Application
    Filed: February 1, 2002
    Publication date: August 7, 2003
    Inventors: Dinko E. Gonzalez Trotter, Bernhard Erich Hermann Claus, Serge Louis Wilfrid Muller
  • Method and apparatus for calibrating an imaging system
    Publication number: 20030072417
    Abstract: A method for calibration of an imaging system, the imaging system including a radiation source and a digital detector. The method includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector.
    Type: Application
    Filed: October 12, 2001
    Publication date: April 17, 2003
    Inventors: John Patrick Kaufhold, John Eric Tkaczyk, Dinko E. Gonzalez Trotter, Jeffrey Wayne Eberhard, Jerry A. Thomas
  • Methods and apparatus for estimating a material composition of an imaged object
    Publication number: 20030072409
    Abstract: A method for estimating a material composition of an imaged object using an imaging system. The imaging system includes a radiation source and a digital detector. The method also includes scanning a plurality of calibration phantoms with varying material composition to acquire a plurality of reference calibration images, estimating an attenuation coefficient thickness product for each pixel in the reference calibration images, and estimating a material composition of a region of interest using the estimated pixelwise coefficient thickness product.
    Type: Application
    Filed: October 12, 2001
    Publication date: April 17, 2003
    Inventors: John Patrick Kaufhold, Jeffrey Wayne Eberhard, Dinko E. Gonzalez Trotter, Bernhard Erich Hermann Claus, John Eric Tkaczyk