Patents by Inventor Dirk François Bentschap Knook

Dirk François Bentschap Knook has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SAMPLE ANALYSIS APPARATUS AND A METHOD OF ANALYSING A SAMPLE
    Publication number: 20110211067
    Abstract: The invention relates to a sample analysis apparatus. The apparatus comprises: a radiation system to irradiate the sample in a vial and an analyser with a camera to analyse the radiation received from the sample in the vial. The apparatus is provided with a holder to releasable hold the vial and with an optical path for the radiation system to irradiate the sample and for the camera to make images of the sample. The radiation system can be used for front lighting of the sample in the vial or for back lighting of the sample in the vial. The camera may be provided with a telecentric lens.
    Type: Application
    Filed: November 2, 2009
    Publication date: September 1, 2011
    Applicant: AVANTIUM HOLDING B.V.
    Inventors: Benjamin McKay, Dirk François Bentschap Knook, Stephan Olivier van Banning, Anita Coetzee