Patents by Inventor Dominik Rudmann
Dominik Rudmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230036932Abstract: The invention concerns sensors (1) for detection of gas, in particular sensors for detection of transcutaneous gas such as CO2, and methods for manufacturing a sensor (1). The sensor (1) comprises at least one radiation source (3) for emitting radiation, at least one detector (4) for detection of radiation emitted by the radiation source (3), and at least one measurement chamber (6) for receiving the sample gas. The radiation source (3), the detector (4), and the measurement chamber (6) are arranged such that at least a part of the radiation propagates along a path passing through the measurement chamber (6). The sensor (1) further comprises a casing (7), wherein the radiation source (3), the detector (4), the measurement chamber (6) are arranged. The sensor (1) has a contact face (8) which is directable towards a measuring site and the sensor (1) has at least one gas-access channel (9) enabling gas to migrate from the contact face (8) into the measurement chamber (6).Type: ApplicationFiled: December 20, 2019Publication date: February 2, 2023Inventors: Dominik RUDMANN, Peter Matthias SCHUMACHER, Marco ZUMBRUNN, Manuel ENGLER, Amirhossein DROUDIAN, Victoria DE LANGE
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Patent number: 11259723Abstract: A sensor (1) for detection of gas, in particular for detection of CO2. The sensor (1) has a contact face (2) which is directed towards a measuring site. The sensor (1) includes at least one radiation source (3), a measurement volume (4) for receiving the gas to be measured, and at least a first detector (5) for detection of radiation transmitted from the source (3) to the first detector (5) through the measurement volume (4). The sensor has a path (6) of the radiation between radiation source (3) and first detector (5). The radiation propagates along the path in a non-imaging way.Type: GrantFiled: April 15, 2019Date of Patent: March 1, 2022Assignee: SenTec AGInventors: Dominik Rudmann, Peter Matthias Schumacher, Joseph Lang, Simon Caruel, Christoph Ellenberger-Girard, Ross Stanley, Rolf Eckert, Branislav Timotijevic, Maurizio Tormen
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Publication number: 20190239788Abstract: A sensor (1) for detection of gas, in particular for detection of CO2. The sensor (1) has a contact face (2) which is directed towards a measuring site. The sensor (1) includes at least one radiation source (3), a measurement volume (4) for receiving the gas to be measured, and at least a first detector (5) for detection of radiation transmitted from the source (3) to the first detector (5) through the measurement volume (4). The sensor has a path (6) of the radiation between radiation source (3) and first detector (5). The radiation propagates along the path in a non-imaging way.Type: ApplicationFiled: April 15, 2019Publication date: August 8, 2019Inventors: Dominik RUDMANN, Peter Matthias SCHUMACHER, Joseph LANG, Simon CARUEL, Christoph ELLENBERGER-GIRARD, Ross STANLEY, Rolf ECKERT, Branislav TIMOTIJEVIC, Maurizio TORMEN
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Patent number: 10307090Abstract: A sensor (1) for detection of gas, in particular for detection of CO2. The sensor (1) has a contact face (2) which can be directed towards a measuring site. The sensor (1) includes at least one radiation source (3), a measurement volume (4) for receiving the gas to be measured, and at least a first detector (5) for detection of radiation transmitted from the source (3) to the first detector (5) through the measurement volume (4). The sensor has a path (6) of the radiation between radiation source (3) and first detector (5). The radiation propagates along the path in a non-imaging way.Type: GrantFiled: July 21, 2014Date of Patent: June 4, 2019Assignee: SenTec AGInventors: Dominik Rudmann, Peter Matthias Schumacher, Joseph Lang, Simon Caruel, Christoph Ellenberger-Girard, Ross Stanley, Rolf Eckert, Branislav Timotijevic, Maurizio Tormen
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Patent number: 10105065Abstract: A device for applying a sensor to a measurement site on a patient's skin has a wall arrangement defining an applicator volume above the patient's skin. The wall arrangement has a patient's side and a sensor side. At least one gas-permeable membrane separates the applicator volume into a first volume directed to the measuring site at the patient's side of the wall arrangement and a second volume separated from the patient's skin and directed to the sensor side of the wall arrangement.Type: GrantFiled: September 25, 2012Date of Patent: October 23, 2018Assignee: SenTec AGInventors: Christoph Ellenberger-Girard, Dominik Rudmann, Peter Matthias Schumacher
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Patent number: 9666745Abstract: A method for manufacturing a compound film comprising a substrate and at least one additional layer is disclosed. The method comprising the steps of depositing at least two chemical elements on the substrate and/or on the at least one additional layer using depositions sources, maintaining depositing of the at least two chemical elements while the substrate and the deposition sources are being moved relative to each other, measuring the compound film properties, particularly being compound film thickness, compound-film overall composition, and compound-film composition in one or several positions of the compound film, comparing the predefined values for the compound film properties to the measured compound film properties, and adjusting the deposition of the at least two chemical elements in case the measured compound film properties do not match the predefined compound film properties.Type: GrantFiled: July 26, 2013Date of Patent: May 30, 2017Assignee: FLISOM AGInventors: Dominik Rudmann, Marc Kaelin, Thomas Studer, Felix Budde
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Publication number: 20160151009Abstract: A sensor (1) for detection of gas, in particular for detection of CO2. The sensor (1) has a contact face (2) which can be directed towards a measuring site. The sensor (1) includes at least one radiation source (3), a measurement volume (4) for receiving the gas to be measured, and at least a first detector (5) for detection of radiation transmitted from the source (3) to the first detector (5) through the measurement volume (4). The sensor has a path (6) of the radiation between radiation source (3) and first detector (5). The radiation propagates along the path in a non-imaging way.Type: ApplicationFiled: July 21, 2014Publication date: June 2, 2016Inventors: Dominik RUDMANN, Peter Matthias SCHUMACHER, Joseph LANG, Simon CARUEL, Christoph ELLENBERGER-GIRARD, Ross STANLEY, Rolf ECKERT, Branislav TIMOTIJEVIC, Maurizio TORMEN
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Patent number: 8927051Abstract: A method for manufacturing a compound film comprising a substrate and at least one additional layer is disclosed. The method comprising the steps of depositing at least two chemical elements on the substrate and/or on the at least one additional layer using depositions sources, maintaining depositing of the at least two chemical elements while the substrate and the deposition sources are being moved relative to each other, measuring the compound film properties, particularly being compound film thickness, compound-film overall composition, and compound-film composition in one or several positions of the compound film, comparing the predefined values for the compound film properties to the measured compound film properties, and adjusting the deposition of the at least two chemical elements in case the measured compound film properties do not match the predefined compound film properties.Type: GrantFiled: September 12, 2007Date of Patent: January 6, 2015Assignee: FLISOM AGInventors: Dominik Rudmann, Marc Kaelin, Thomas Studer, Felix Budde
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Patent number: 8895100Abstract: A method for manufacturing a compound film comprising a substrate and at least one additional layer is disclosed. The method comprising the steps of depositing at least two chemical elements on the substrate and/or on the at least one additional layer using depositions sources, maintaining depositing of the at least two chemical elements while the substrate and the deposition sources are being moved relative to each other, measuring the compound film properties, particularly being compound film thickness, compound-film overall composition, and compound-film composition in one or several positions of the compound film, comparing the predefined values for the compound film properties to the measured compound film properties, and adjusting the deposition of the at least two chemical elements in case the measured compound film properties do not match the predefined compound film properties.Type: GrantFiled: September 12, 2007Date of Patent: November 25, 2014Assignee: FLISOM AGInventors: Dominik Rudmann, Marc Kaelin, Thomas Studer, Felix Budde
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Publication number: 20140303462Abstract: A device for applying a sensor to a measurement site on a patient's skin has a wall arrangement defining an applicator volume above the patient's skin The wall arrangement has a patient's side and a sensor side. At least one gas-permeable membrane separates the applicator volume into a first volume directed to the measuring site at the patient's side of the wall arrangement and a second volume separated from the patient's skin and directed to the sensor side of the wall arrangement.Type: ApplicationFiled: September 25, 2012Publication date: October 9, 2014Inventors: Christoph Ellenberger-Girard, Dominik Rudmann, Peter Matthias Schumacher
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Publication number: 20130312664Abstract: A method for manufacturing a compound film comprising a substrate and at least one additional layer is disclosed. The method comprising the steps of depositing at least two chemical elements on the substrate and/or on the at least one additional layer using depositions sources, maintaining depositing of the at least two chemical elements while the substrate and the deposition sources are being moved relative to each other, measuring the compound film properties, particularly being compound film thickness, compound-film overall composition, and compound-film composition in one or several positions of the compound film, comparing the predefined values for the compound film properties to the measured compound film properties, and adjusting the deposition of the at least two chemical elements in case the measured compound film properties do not match the predefined compound film properties.Type: ApplicationFiled: July 26, 2013Publication date: November 28, 2013Applicant: FLISOM AGInventors: Dominik RUDMANN, Marc KAELIN, Thomas STUDER, Felix BUDDE
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Patent number: 8420979Abstract: A method and an apparatus for laser beam processing of an element (12) that has a total transmittance for light of at least 10?5, comprising a laser unit (1) for generating a laser beam on one side of the to-be-processed element (12), an illumination unit (7), an imaging system (10) comprising a sensor unit on the one side of the to-be-processed element (12), the sensor unit recording residual light that results from light of the illumination unit (7), a scanning unit (2) for adjusting the laser beam processing position, and a control unit. The control unit is operatively connected to the laser unit (1), the imaging system (10) and the scanning unit (2), and the illumination unit (7) is positioned on the other side of the to-be-processed element (12) in relation to the laser unit (1). Since the to-be-processed element (12) allows light to pass through an otherwise opaque or almost opaque layer, a good contrast is obtained that is used to determine the position of the laser beam with high precision.Type: GrantFiled: July 24, 2007Date of Patent: April 16, 2013Assignee: Flisom AGInventors: Felix Budde, Thomas Studer, Marc Kaelin, Dominik Rudmann
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Publication number: 20100247745Abstract: A method for manufacturing a compound film comprising a substrate and at least one additional layer is disclosed. The method comprising the steps of depositing at least two chemical elements on the substrate and/or on the at least one additional layer using depositions sources, maintaining depositing of the at least two chemical elements while the substrate and the deposition sources are being moved relative to each other, measuring the compound film properties, particularly being compound film thickness, compound-film overall composition, and compound-film composition in one or several positions of the compound film, comparing the predefined values for the compound film properties to the measured compound film properties, and adjusting the deposition of the at least two chemical elements in case the measured compound film properties do not match the predefined compound film properties.Type: ApplicationFiled: September 12, 2007Publication date: September 30, 2010Inventors: Dominik Rudmann, Marc Kaelin, Thomas Studer, Felix Budde
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Publication number: 20100224604Abstract: A method and an apparatus for laser beam processing of an element (12) that has a total transmittance for light of at least 10?5, comprising a laser unit (1) for generating a laser beam on one side of the to-be-processed element (12), an illumination unit (7), an imaging system (10) comprising a sensor unit on the one side of the to-be-processed element (12), the sensor unit recording residual light that results from light of the illumination unit (7), a scanning unit (2) for adjusting the laser beam processing position, and a control unit. The control unit is operatively connected to the laser unit (1), the imaging system (10) and the scanning unit (2), and the illumination unit (7) is positioned on the other side of the to-be-processed element (12) in relation to the laser unit (1). Since the to-be-processed element (12) allows light to pass through an otherwise opaque or almost opaque layer, a good contrast is obtained that is used to determine the position of the laser beam with high precision.Type: ApplicationFiled: July 24, 2007Publication date: September 9, 2010Inventors: Felix Budde, Thomas Studer, Marc Kaelin, Dominik Rudmann