Abstract: A method for thermoplastic coating composite structures includes applying a crystalline crystalline multi-axially oriented thermoplastic layer onto a working surface of a tool. A layer of composite material is applied onto the crystalline crystalline multi-axially oriented thermoplastic layer, and the crystalline crystalline multi-axially oriented thermoplastic layer and the layer of composite material are cocured at a specific temperature and pressure in an autoclave. The softening temperature of the crystalline crystalline multi-axially oriented thermoplastic layer is not substantially greater than the curing temperature of the composite material.

Abstract: The present invention relates to a system for imaging the surface of a substrate through a coating on the substrate. The system includes an infrared light source positioned to cast an infrared light upon the substrate to thereby create reflected light. A focal plane array may be positioned to receive the reflected light and generate an image therefrom. At least one optical filter may be disposed between the substrate and the focal plane array so as to pass only coating transparent wavelengths of the reflected light along an optical path between the infrared light source and the focal plane array thereby visually revealing irregular structural features of the substrate as at least one image.

Abstract: The present invention relates to a system for imaging the surface of a substrate through a coating on the substrate. The system includes an infrared light source positioned to cast an infrared light upon the substrate to thereby create reflected light. A focal plane array may be positioned to receive the reflected light and generate an image therefrom. At least one optical filter may be disposed between the substrate and the focal plane array so as to pass only coating transparent wavelengths of the reflected light along an optical path between the infrared light source and the focal plane array thereby visually revealing irregular structural features of the substrate as at least one image.

Abstract: A method of thermoplastic coating composite structures includes heating a tool. A thermoplastic layer is deposited onto the heated tool by thermal spraying a thermoplastic on the heated tool. Composite material is applied onto the thermoplastic layer. The thermoplastic layer and the composite material are then cured.

Abstract: A method for thermoplastic coating composite structures includes applying a crystalline crystalline multi-axially oriented thermoplastic layer onto a working surface of a tool. A layer of composite material is applied onto the crystalline crystalline multi-axially oriented thermoplastic layer, and the crystalline crystalline multi-axially oriented thermoplastic layer and the layer of composite material are cocured at a specific temperature and pressure in an autoclave. The softening temperature of the crystalline crystalline multi-axially oriented thermoplastic layer is not substantially greater than the curing temperature of the composite material.

Abstract: A method of thermoplastic coating composite structures includes heating a tool. A thermoplastic layer is deposited onto the heated tool by thermal spraying a thermoplastic on the heated tool. Composite material is applied onto the thermoplastic layer. The thermoplastic layer and the composite material are then cured.

Abstract: A method for thermoplastic coating composite structures includes applying a crystalline crystalline multi-axially oriented thermoplastic layer onto a working surface of a tool. A layer of composite material is applied onto the crystalline crystalline multi-axially oriented thermoplastic layer, and the crystalline crystalline multi-axially oriented thermoplastic layer and the layer of composite material are cocured at a specific temperature and pressure in an autoclave. The softening temperature of the crystalline crystalline multi-axially oriented thermoplastic layer is not substantially greater than the curing temperature of the composite material.

Abstract: The present invention relates to a system for imaging the surface of a substrate through a coating on the substrate. The system includes an infrared light source positioned to cast an infrared light upon the substrate to thereby create reflected light. A focal plane array may be positioned to receive the reflected light and generate an image therefrom. At least one optical filter may be disposed between the substrate and the focal plane array so as to pass only coating transparent wavelengths of the reflected light along an optical path between the infrared light source and the focal plane array thereby visually revealing irregular structural features of the substrate as at least one image.

Abstract: In accordance with the present invention, there is provided a spectral nondestructive method for evaluating substrate surface characteristics of a sample substrate. The sample substrate has a sample substrate surface and a generally visually nontransmissive sample coating disposed on the sample substrate surface. The sample coating is transmissive within a first infrared spectral wavelength range and the sample substrate is reflective within the first infrared spectral wavelength range. The method begins with directing infrared radiation from an infrared radiation source towards the coated sample substrate. Specular and diffuse infrared radiation reflected from the coated sample substrate is collected. The reflected radiation is measured as a function of wavelength in the first infrared spectral wavelength range to obtain measured reflectance data representative of the reflectance of the coated sample substrate.

Abstract: Apparatus for exposing a selected area of a film, and comprising a holding assembly for holding a film, and a first support assembly connected to and supporting the holding assembly. The apparatus further comprises an exposure area control assembly located adjacent the holding assembly and forming an adjustable opening to expose a selected area of the film, and a second support assembly connected to and supporting the exposure area control assembly. Preferably, the first support assembly supports the film assembly for movement upward and downward and forward and rearward, and for pivotal movement about horizontal and vertical axes. Also, the second support assembly supports the exposure area control assembly for forward and rearward movement, and for pivotal movement about horizontal and vertical axes.

Abstract: An electron beam from a scanning electron microscope, or X-rays from an external X-ray source, impinges on a material sample surface thereby causing the generation of fluorescent X-rays characteristic of the elements present in the sample. An improved energy dispersive X-ray detector system for materials analysis, based on a monolithically fabricated thermal detector array and solid state refrigeration system, is described. The detector array converts the X-ray photons to heat, and the heat is measured as a rise in temperature by thermistors in the individual detector elements in the array. The small detector elements in the array are kept at a low temperature so as to achieve an energy resolution of less than 5 eV, and the multiple elements in the array insure that a sufficient X-ray count rate for normal materials analysis is achieved.