Abstract: A configurable and modular probe device for electrical connections. The probe device has multiple blocks capable of inter-fitting into various layouts. Each block has four sidewalls. Two adjacent sidewalls have a protrusion and the respective opposite sidewalls have a cavity corresponding to the protrusion. The protrusion of one block can removably mate with the cavity of a neighboring block. Each block further has a central cavity extending from a top surface to a bottom surface of the block. A probe snugly fits into the central cavity.

Abstract: A connector includes a receptacle having a body defining apertures and having a mating face and socket contacts each defining an opening aligned with an aperture. The connector also includes a plug having an outer casing defining a cavity and having a mating end and contacts positioned within the cavity and coupled to the outer casing, each having a pin tip. The plug also includes a pin protection plate slidably coupled to the outer casing, enclosing at least a portion of each contact within the cavity, and defining pin guides each aligned with one of the contacts. When the mating end is aligned with the mating face and force is applied to the outer casing towards the body, the pin protection plate slides into the cavity and the pin tip of the contacts extends beyond the pin protection plate into a socket contact via one of the apertures.

Abstract: A connector includes a receptacle having a body defining apertures and having a mating face and socket contacts each defining an opening aligned with an aperture. The connector also includes a plug having an outer casing defining a cavity and having a mating end and contacts positioned within the cavity and coupled to the outer casing, each having a pin tip. The plug also includes a pin protection plate slidably coupled to the outer casing, enclosing at least a portion of each contact within the cavity, and defining pin guides each aligned with one of the contacts. When the mating end is aligned with the mating face and force is applied to the outer casing towards the body, the pin protection plate slides into the cavity and the pin tip of the contacts extends beyond the pin protection plate into a socket contact via one of the apertures.

Abstract: A configurable and modular probe device for electrical connections. The probe device has multiple blocks capable of inter-fitting into various layouts. Each block has four sidewalls. Two adjacent sidewalls have a protrusion and the respective opposite sidewalls have a cavity corresponding to the protrusion. The protrusion of one block can removably mate with the cavity of a neighboring block. Each block further has a central cavity extending from a top surface to a bottom surface of the block. A probe snugly fits into the central cavity.

Abstract: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Abstract: An orthopedic fixation pin removal device includes a lever rotatively disposed on a body, the lever is operably disposed by a rack and pinion, with pivoting of the lever the rack is moved in unison with a fixation pin engaging assembly, so that the fixation pin is moved in uniform motion. A fixed grip is oppositely disposed from the lever to provide bracing during removal of the fixation pin.

Abstract: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Abstract: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Abstract: A probe array wafer includes a substrate upon which a plurality of compliant probes are mounted. Pairs of axially aligned probes may be electrically connected together to provide a pass through power connection from the test equipment to the device under test. Likewise, pairs of axially aligned probes may be electrically connected together to provide a ground connection from the test equipment to the device under test.

Abstract: A probe array wafer includes a substrate upon which a plurality of compliant probes are mounted. Pairs of axially aligned probes may be electrically connected together to provide a pass through power connection from the test equipment to the device under test. Likewise, pairs of axially aligned probes may be electrically connected together to provide a ground connection from the test equipment to the device under test.

Abstract: An adjustable test socket for aligning an electronic device with spring probes in a test fixture is provided having two adjustable walls or four adjustable walls.

Abstract: A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder, flange or barb extending from the body of the plunger.

Abstract: A contact spring probe includes a plunger and a spring with a pair of opposed closed coils separated by an open coil. The plunger is secured at one end to one set of closed coils with a shoulder, flange or barb extending from the body of the plunger.