Abstract: An SRAM memory cell structure utilizing a read driver transistor for isolating the read current from the latch nodes of the cell during read operations and a column select write transistor for selection of a single cell during write operations, and a method of operating the same is discussed. The SRAM memory cell structure (single-ended or differential cell) allows independent optimization of the static noise margin, trip voltage, and read current, thereby avoiding some of the static noise margin and trip voltage problems of conventional SRAM cells (e.g., a conventional 6T differential cell). In one implementation, the SRAM memory cell comprises a 7T single-ended cell including first and second cross-coupled inverters, having a first and second latch nodes, respectively. The cell further comprises a first write pass transistor connected between the first latch node of the first inverter and a first pass node, and a first wordline pass transistor connected between the first pass node and a first bitline.

Abstract: A method of operating a memory circuit to reduce standby current is disclosed. The method includes applying a first voltage (Vdd) to a power terminal (224) of a memory cell having a first (612) and a second (614) data terminal. A data bit is stored in a memory cell (600,602,604,606). A second voltage (VDA) different from the first voltage is applied to the power terminal. A third voltage (Ground) is applied to the first and second data terminals. The first voltage is applied to the power terminal.