Abstract: A single chip dynamic random access memory has a memory core, including dynamic random access memory cells, and a clock receiver circuit to receive an external clock signal. A delay locked loop circuit is coupled to the clock receiver circuit. In a first power mode, the delay locked loop circuit and the clock receiver circuit are turned on. Power consumption in the first power mode is less than that consumed while in an active mode. In a second power mode, the delay locked loop circuit is turned off. The memory is configured to receive a command that specifies a power down mode, to turn off the delay locked loop circuit in response to the command that specifies the power down mode, and to operate the memory device in a standby power mode. The delay locked loop circuit and the clock receiver circuit are turned on in a standby mode.

Abstract: An integrated circuit memory device includes a first set of pins and a memory core. The first set of pins receive, using a clock signal, a write command and a read command. Control information is issued internally in response to the write command after a predetermined delay time transpires following receipt of the write command, the control information initiating the write operation in the memory device. A second set of pins output the read data after a first delay time transpires from when the read command is received. Each pin of the second set of pins outputs two bits of read data during a clock cycle of the clock signal. The second set of pins also receive write data after a second delay time has transpired from when the write command is received. The second delay time is based on the first delay time.

Abstract: A memory system has first, second and third interconnects and an integrated circuit memory device coupled to the interconnects. The second interconnect conveys a write command and a read command. The third interconnect conveys write data and read data. The integrated circuit memory device includes a pin coupled to the first interconnect to receive a clock signal. The memory device also includes a first plurality of pins coupled to the second interconnect to receive the write command and read command, and a second plurality of pins coupled to the third interconnect to receive write data and to assert read data. Control information is applied to initiate the write operation after a first predetermined delay time transpires from when the write command is received. During a clock cycle of the clock signal, two bits of read data are conveyed by each pin of the second plurality of pins.

Abstract: An integrated circuit memory device having delayed write command processing includes a first set of pins coupled to a memory core, the first set of pins to receive a row address followed by a column address. A second set of pins, coupled to memory core, are used to receive a sense command followed by a write command. The sense command specifies the sensing of a row of memory cells identified by the row address, and the write command specifies that the memory device receive write data and store the write data at a column location identified by the column address. The write command is posted internally to the memory device after a first delay has transpired from when the write command is received at the second set of pins.

Abstract: An integrated circuit memory device has a first set of pins to receive, using a clock signal, a row address followed by a column address. The device has a second set of pins to receive, using the clock signal, a sense command and a write command. The sense command specifies that the device activate a row of memory cells identified by the row address. The write command specifies that the memory device receive write data and store the write data at a location, identified by the column address, in the row of memory cells. The write command is posted internally to the memory device after a first delay has transpired from a first time period in which the write command is received at the second set of pins. The write data is received at a third set of pins after a second delay has transpired from the first time period.

Abstract: A semiconductor memory device has a memory core that includes at least eight banks of dynamic random access storage cells and an internal data bus coupled to the memory core. The internal data bus receives a plurality of data bits from a selected bank of the memory core. The semiconductor memory device further comprises a first interface to receive a read command from external to the semiconductor memory device and a second interface to output first and second subsets of the plurality of data bits. The first subset is output during a first phase of an external clock signal and the second subset is output during a second phase of the external clock signal. The first phase includes a first edge transition and the second phase includes a second edge transition. The second edge transition is an opposite edge transition with respect to the first edge transition.

Abstract: A method and apparatus for adjusting the performance of a memory system is provided. A memory system comprises a master device and a slave device. A memory channel couples the master device to the slave device such that the slave device receives the system operating information from the master device via the memory channel. The slave device further includes means for tuning circuitry within the slave device such that the performance of the memory system is improved.

Abstract: A receiver adapted to be coupled to a data bus and configured to receive data in accordance with a receive clock includes first and second delay-locked loops. The first delay-locked loop is configured to generate a plurality of phase vectors from a first reference clock, and the second delay-locked loop is coupled to the first delay-locked loop and configured to generate the receive clock from at least one phase vector selected from the plurality of phase vectors and a second reference clock.

Abstract: A system includes a first integrated circuit device and a second integrated circuit device. The first device transmits a data sequence to the second integrated circuit device, and the second device samples the data sequence to produce receiver data. The second device then transmits the receiver data back to the first device. Within the first integrated circuit device, a comparison between the data sequence and the receiver data is performed, and based on the comparison, the first device generates information representative of a calibrated timing offset. The first device uses the information representative of the calibrated timing offset to adjust timing associated with transferring write data from the first integrated circuit to the second integrated circuit.

Abstract: A signaling system includes a signaling path, a master device coupled to the signaling path, a slave device coupled to the signaling path, and a clock generator. The slave device includes timing circuitry to generate an internal clock signal having a phase offset relative to a clock signal supplied by the clock generator, the phase offset being determined at least in part by a signal propagation time on the signal path.

Abstract: A memory device has interface circuitry and a memory core which make up the stages of a pipeline, each stage being a step in a universal sequence associated with the memory core. The memory device has a plurality of operation units such as precharge, sense, read and write, which handle the primitive operations of the memory core to which the operation units are coupled. The memory device further includes a plurality of transport units configured to obtain information from external connections specifying an operation for one of the operation units and to transfer data between the memory core and the external connections. The transport units operate concurrently with the operation units as added stages to the pipeline, thereby creating a memory device which operates at high throughput and with low service times under the memory reference stream of common applications.

Abstract: An efficient method and apparatus for characterizing circuit devices is disclosed. In one embodiment, multiple test patterns for testing a circuit device are stored in a tester. Each test pattern includes both test data and control data that defines at least in part a sweep point at which the circuit device is tested. Thus, the tester can generate stimulus vectors for multiple sweep points without requiring control system intervention. Pass/fail indicators, each of which represents pass/fail results associated with a sweep point, are derived from the test results and stored in a Fail Capture Memory. A pass/fail boundary of the DUT can be determined from the contents of the Fail Capture Memory.

Abstract: Disclosed herein are embodiments of an asynchronous memory device that use internal delay elements to enable memory access pipelining. In one embodiment, the delay elements are responsive to an input load control signal, and are calibrated with reference to periodically received timing pulses. Different numbers of the delay elements are configured to produce different asynchronous delays and to strobe sequential pipeline elements of the memory device.

Abstract: An output driver has an output multiplexor and an output current driver. The output multiplexor receives a data signal and outputs a q-node signal. The output current 5 river receives the q-node signal and drives a bus based on the q-node signal. The output multiplexor processes the data signal in various ways to generate the q-node signal. The output current driver is responsive to current control bits to select a amount of output drive current. In addition, the output multiplexor is controlled such that the output impedance of the output current driver is maintained within a predetermined range.

Abstract: A system includes a master device connected to one or more slave devices via a channel, the channel communicating an externally generated first system clock towards the master device. A delay locked loop circuit receives the first system clock and a second phase feedback signal as inputs and generates a transmit clock signal. A phase offset circuit receives the transmit system clock and generates a phase shifted version of the transmit clock signal as a second system clock. A first phase detector receives a receive system clock and the transmit system clock and generates a first phase feedback signal. A delay element receives the first system clock and the first phase feedback signal and generates a delayed first system clock. A second phase detector receives the delayed first system clock and the second system clock and generates the second phase feedback signal.

Abstract: A method is described for providing a memory with a serial sequence of write enable signals that are offset in time with respect to respective data received by a plurality of data inputs of the memory. A memory is also described with an array for data storage, a plurality of data input pins, and a separate pin for receiving either additional data or a serial sequence of write enable signals applicable to data received by the plurality of data input pins. The additional data that the separate pin can receive includes, for example, error detection and correction (EDC) information. A method is also described for multiplexing write enable information and error detection and correction information.

Abstract: A memory device having a memory core is described. The memory device includes a clock receiver circuit, a control interface, a data interface, a delay locked loop circuit, a read pipeline circuit and a circuit to provide an internal clock signal. The clock receiver circuit receives an external clock signal. The control interface receives a command that specifies a read operation to the memory device. The data interface transfers data between the memory device and an external set of signal lines. The delay locked loop circuit, coupled to the clock receiver circuit, to generate the internal clock signal using the external clock signal. The read pipeline circuit provides read data accessed from the memory core to the data interface. The circuit provides the internal clock signal to the read pipeline circuit in response to receipt of the command that specifies the read operation.

Abstract: Described is a memory system in which the memory core organization changes with device width. The number of physical memory banks accessed reduces with device width, resulting in reduced power usage for relatively narrow memory configurations. Increasing the number of logic memory banks for narrow memory widths reduces the likelihood of bank conflicts, and consequently improves speed performance.

Abstract: A memory device includes an interconnect with mask pins and a memory core for storing data. A memory interface circuit is connected between the interconnect and the memory core. The memory interface circuit selectively processes write mask data from the mask pins or precharge instruction signals from the mask pins.

Abstract: A signaling system includes a signaling path, a master device coupled to the signaling path, a slave device coupled to the signaling path, and a clock generator. The slave device includes timing circuitry to generate an internal clock signal having a phase offset relative to a clock signal supplied by the clock generator, the phase offset being determined at least in part by a signal propagation time on the signal path.