Abstract: A probe for scanning a surface of an arbitrarily sized sample in magnetic resonance force microscopy comprising a magnetic sensor having a support element coupled to a magnetic particle, an RF antenna, at least partially circumscribing the magnetic sensor, for emitting an RF magnetic field across a portion of the sample and an optical sensor, positioned proximate the magnetic sensor, for detecting displacement of the support element.

Abstract: An apparatus for scanning over a surface of an arbitrarily sized sample in magnetic resonance force microscopy comprising a cantilever for holding a magnetic particle at the cantilever tip, an RF antenna, positioned around the cantilever, for emitting an RF magnetic field across a portion of the sample causing spin of particles in the sample to reverse attracting and opposing the magnetic particle at the cantilever tip, an optical fiber, positioned close to the cantilever tip, for measuring displacements of the cantilever tip where the RF antenna, cantilever, magnetic particle and optical fiber are in fixed positions relative to each other and the sample is positionable according to a sample stage.

Abstract: An apparatus for performing magnetic resonance force microscopy on one or more large area samples comprising a base plate, one or more heat sink plates coupled to the base plate, one or more suspension mechanisms coupled to the base plate and the heat sink plates, a probe head suspended from the one or more suspension mechanisms for scanning the one or more samples and a sample cylinder comprising a sample stage coupled to the probe head for sample positioning and an outer drum for isolating the sample stage.

Abstract: An apparatus for scanning over a surface of an arbitrarily sized sample in magnetic resonance force microscopy comprising a cantilever for holding a magnetic particle at the cantilever tip, an RF antenna, positioned around the cantilever, for emitting an RF magnetic field across a portion of the sample causing spin of particles in the sample to reverse attracting and opposing the magnetic particle at the cantilever tip, an optical fiber, positioned close to the cantilever tip, for measuring displacements of the cantilever tip where the RF antenna, cantilever, magnetic particle and optical fiber are in fixed positions relative to each other and the sample is positionable according to a sample stage.

Abstract: A probe for scanning a surface of an arbitrarily sized sample in magnetic resonance force microscopy comprising a magnetic sensor having a support element coupled to a magnetic particle, an RF antenna, at least partially circumscribing the magnetic sensor, for emitting an RF magnetic field across a portion of the sample and an optical sensor, positioned proximate the magnetic sensor, for detecting displacement of the support element.

Abstract: An apparatus for performing magnetic resonance force microscopy on one or more large area samples comprising a base plate, one or more heat sink plates coupled to the base plate, one or more suspension mechanisms coupled to the base plate and the heat sink plates, a probe head suspended from the one or more suspension mechanisms for scanning the one or more samples and a sample cylinder comprising a sample stage coupled to the probe head for sample positioning and an outer drum for isolating the sample stage.

Abstract: A control apparatus for extracting data from an MRFM system in accordance with exemplary embodiments of the present invention comprising a visualization controller for controlling operation of the MRFM system, an initialization module, coupled to the visualization controller, for retrieving initialization data from a data source, a data collection module, coupled to the visualization controller, for extracting data from the MRFM system and an imaging module for generating image data based on the extracted data.