Abstract: A sorting apparatus can include a component carrier structured to transport a component along a travel path, a first sort bin, a second sort bin, a first transfer station structured to transfer a component from the component carrier at a first transfer position along the travel path to the first sort bin and a second transfer station structured to transfer a component from the component carrier at a second transfer position along the travel path to the second sort bin. In this embodiment, the distance between the first transfer position and the second transfer position can be less than a width of at least one of the first sort bin and the second sort bin.

Abstract: A gap set device for an electronic component handler is provided. The electronic component handler includes a test accessory mounted to it. The test accessory is movable between a first position away from a tool and a second position closer to the tool. A gap set device is mounted to the test accessory and the tool and has a portion movable with respect to the test accessory. When the test accessory is in the second position, the portion of the gap set device contacts the component support structure to define a gap between the test accessory and the component support structure.

Abstract: A component loader orients a component along its long-axis for transfer from a rotatable load plate. The load plate has an outer peripheral edge and an upper surface inclined from a horizontal plane. Slots on the upper surface terminate at the outer edge of the load plate and are sized to receive at least one elongate chip lying with its long axis perpendicular to the axis of the load plate and in parallel with radius of the load plate. An outer wall conforms to the curvature of the outer edge and is mounted adjacent thereto. A transfer slot extends axially from and into the upper surface of the load plate on outer ends of the slots and terminates at the outer edge of the load plate. Each transfer slot is shaped so that a chip descending therein from a slot has a ninety degree rotation about the long axis.

Abstract: A gap set device for an electronic component handler is provided. The electronic component handler includes a linear bearing having a test accessory mounted to it. The test accessory is movable between a first position away from a tool and a second position closer to the tool. A setting post is extendable from the test accessory such that when the test accessory moves from the first position to the second position the setting post can fix a gap between the test accessory and the tool.

Abstract: An apparatus for testing electric components supported on a test plate for transport along a of travel path through a test station includes an electrical contactor at the station for contacting the plate surface and at least one electronic component transported to the test station by the test plate for testing. An adjustable force applicator supplies contact pressure to the contactor to apply a substantially constant force over a large working travel range. The applicator can include an air cylinder having a force applying pin applying force to a position located between a working point of the contactor and the pivot point such that the applied force variation is reduced as a result of a lever reduction ratio between the working point and the pin position.

Abstract: A component loader orients a component along its long-axis for transfer from a rotatable load plate. The load plate has an outer peripheral edge and an upper surface inclined from a horizontal plane. Slots on the upper surface terminate at the outer edge of the load plate and are sized to receive at least one elongate chip lying with its long axis perpendicular to the axis of the load plate and in parallel with radius of the load plate. An outer wall conforms to the curvature of the outer edge and is mounted adjacent thereto. A transfer slot extends axially from and into the upper surface of the load plate on outer ends of the slots and terminates at the outer edge of the load plate. Each transfer slot is shaped so that a chip descending therein from a slot has a ninety degree rotation about the long axis.

Abstract: A component loader for orienting a component along its long-axis for transfer to transmission means such as a carrier belt. The loader includes a rotatable load plate having an outer peripheral edge and an upper surface where the upper surface is inclined from a horizontal plane. A plurality of slots is on the upper surface, and each is located about the outer edge of the load plate. Each of the plurality of slots is sized to receive at least one chip, preferably lying with its long axis perpendicular to the rotational axis of the rotatable load plate. An outer wall conforms to the curvature of the outer peripheral edge and is mounted adjacent thereabout. A transfer slot extends axially into the upper surface of the load plate. Preferably, each transfer slot is shaped so that a chip descending into each transfer slot from a respective slot has a ninety degree rotation about the long axis.

Abstract: A gap set device for an electronic component handler is provided. The electronic component handler includes a linear bearing having a test accessory mounted to it. The test accessory is movable between a first position away from a tool and a second position closer to the tool. A setting post is extendable from the test accessory such that when the test accessory moves from the first position to the second position the setting post can fix a gap between the test accessory and the tool.

Abstract: An apparatus for testing electric components supported on a test plate for transport along a travel path through a test station includes an electrical contactor at the station for contacting the plate surface and at least one electronic component transported to the station by the plate for testing. An adjustable force applicator supplies contact pressure to the contactor to apply a substantially constant force over a large working travel range. The applicator can include an air cylinder having a force applying pin applying force to a position located between a working point of the contactor and the pivot point such that the applied force variation is reduced as a result of a lever reduction ratio between the working point and the pin position.

Abstract: A method of profiling the border of termination paste applied to a chip capacitor electrode comprising the steps of casting a layer of termination paste of finite thickness; passing a profiling element through the upper part of the layer of paste, the element having an exterior profile that is arranged to dip into the paste and scrape some of the paste from the upper part of the paste layer to form a reverse profile in the layer of the paste; and, dipping a chip capacitor electrode into the paste layer at the reverse profile formed therein, to terminate the capacitor with the profile formed in the paste.