Abstract: The invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.

Abstract: Using the device and method of the present invention, high energy photons, or gamma radiation, impinge upon a target comprising a nanomaterial that includes a target isotope, resulting in the release of one or more neutrons from the target isotope. This neutron release creates an effect known as “kinematic recoil,” which results in a recoiling photo-produced radioisotope which is ejected from the nanomaterial and can be harvested in high specific activity.

Abstract: The present invention relates to variants of the model halophile Halobacterium sp. NRC-1 that have been exposed to cycles of irradiation with high doses of 18-20 MeV electrons. These novel isolated halobacterium exhibit increased resistance to radiation and may be used for bioremediation of toxic and highly radioactive waste sites and/or for studying and modulating the mechanism involved in such resistance.

Abstract: The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.

Abstract: The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.