Patents by Inventor Dulin LI

Dulin LI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High-precision resistance measurement system and method combining micro-differential method and ratiometric method
    Patent number: 11327099
    Abstract: Disclosed are a high-precision resistance measurement system and method combining a micro-differential method and a ratiometric method. The system includes a constant-current source, a reference resistor, a first differential amplifier, a programmable gain amplifier (PGA), an ADC, a microprocessor, a DAC and a to-be-measured resistor interface. The reference resistor and a to-be-measured resistor are connected in series between the constant-current source and ground. The voltage across the reference resistor is inputted to the first differential amplifier, and the output of the first differential amplifier is used as the reference voltage for the ADC and the DAC. The single-ended voltage to ground of the to-be-measured resistor and the output voltage of the DAC are inputted to the PGA in differential manner, and the PGA outputs the amplified difference voltage to the ADC. The output terminal of the ADC and the input terminal of the DAC are both connected to the microprocessor.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: May 10, 2022
    Assignee: CENTRAL SOUTH UNIVERSITY
    Inventors: Zeyu Chen, Shaoqiang Liu, Dulin Li, Xiaoping Fan, Yiming Zhang
  • HIGH-PRECISION RESISTANCE MEASUREMENT SYSTEM AND METHOD COMBINING MICRO-DIFFERENTIAL METHOD AND RATIOMETRIC METHOD
    Publication number: 20220091169
    Abstract: Disclosed are a high-precision resistance measurement system and method combining a micro-differential method and a ratiometric method. The system includes a constant-current source, a reference resistor, a first differential amplifier, a programmable gain amplifier (PGA), an ADC, a microprocessor, a DAC and a to-be-measured resistor interface. The reference resistor and a to-be-measured resistor are connected in series between the constant-current source and ground. The voltage across the reference resistor is inputted to the first differential amplifier, and the output of the first differential amplifier is used as the reference voltage for the ADC and the DAC. The single-ended voltage to ground of the to-be-measured resistor and the output voltage of the DAC are inputted to the PGA in differential manner, and the PGA outputs the amplified difference voltage to the ADC. The output terminal of the ADC and the input terminal of the DAC are both connected to the microprocessor.
    Type: Application
    Filed: June 5, 2020
    Publication date: March 24, 2022
    Applicant: CENTRAL SOUTH UNIVERSITY
    Inventors: Zeyu CHEN, Shaoqiang LIU, Dulin LI, Xiaoping FAN, Yiming ZHANG