Patents by Inventor Duosi Tang

Duosi Tang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detection structure, display panel, detection device for detecting display panel and detection system
    Patent number: 11961433
    Abstract: A detection structure, a display panel, a detection device and a detection system, the detection structure is located in display panel, and the detection structure includes test units and groups of first connecting lines; each of the test units includes chip bonding part, test pin parts located at chip bonding part, and groups of second connecting lines; in each test units, first end of each group in groups of second connecting lines is connected with test pin parts, and second end of each group of second connecting lines is connected with chip bonding part; in two adjacent test units in test units, two adjacent test pin parts are respectively connected with first end and second end of one group of first connecting lines; and when detection structure is used in lightening test, at least two test units arranged at intervals are configured for being electrically connected with detection device respectively.
    Type: Grant
    Filed: August 19, 2021
    Date of Patent: April 16, 2024
    Assignees: FUZHOU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Xin Fang, Duosi Tang, Yang Yu, Wenchao Wang
  • DETECTION STRUCTURE, DISPLAY PANEL, DETECTION DEVICE AND DETECTION SYSTEM
    Publication number: 20220044605
    Abstract: A detection structure, a display panel, a detection device and a detection system, the detection structure is located in display panel, and detection structure includes test units and groups of first connecting lines; each test units includes chip bonding part, test pin parts located at chip bonding part, and groups of second connecting lines; in each test units, first end of each group in groups of second connecting lines is connected with test pin parts, and second end of each group of second connecting lines is connected with chip bonding part; in any two adjacent test units in test units, two adjacent test pin parts are respectively connected with first end and second end of one group of first connecting lines; and when detection structure is used in lightening test, at least two test units arranged at intervals are configured for being electrically connected with detection device respectively.
    Type: Application
    Filed: August 19, 2021
    Publication date: February 10, 2022
    Applicants: Fuzhou BOE Optoelectronics Technology Co., Ltd., BOE Technology Group Co., Ltd.
    Inventors: Xin Fang, Duosi Tang, Yang Yu, Wenchao Wang