Patents by Inventor Earl M. Thurman

Earl M. Thurman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7855356
    Abstract: A method of determining an empirical formula of an analyte ion from a measured mass spectrum including a main peak and one or more isotope peaks. The method comprises comparing a relative isotopic intensity of the measured isotope peak to a calculated relative isotopic intensity of an isotopic ion of a proposed empirical formula and comparing a relative mass defect of the measured isotope peak to a calculated relative mass defect of the isotopic ion of the proposed empirical formula. The proposed empirical formula is identified as a potential candidate for the analyte ion based on these comparisons.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: December 21, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Jerry A. Zweigenbaum, Earl M. Thurman, Imma Ferrer
  • Publication number: 20090078863
    Abstract: A method of determining an empirical formula of an analyte ion from a measured mass spectrum including a main peak and one or more isotope peaks. The method comprises comparing a relative isotopic intensity of the measured isotope peak to a calculated relative isotopic intensity of an isotopic ion of a proposed empirical formula and comparing a relative mass defect of the measured isotope peak to a calculated relative mass defect of the isotopic ion of the proposed empirical formula. The proposed empirical formula is identified as a potential candidate for the analyte ion based on these comparisons.
    Type: Application
    Filed: November 26, 2008
    Publication date: March 26, 2009
    Inventors: Jerry A. Zweigenbaum, Earl M. Thurman, Imma Ferrer
  • Patent number: 7462818
    Abstract: A method of determining an empirical formula of an analyte ion from a measured mass spectrum including a main peak and one or more isotope peaks. The method comprises comparing a relative isotopic intensity of the measured isotope peak to a calculated relative isotopic intensity of an isotopic ion of a proposed empirical formula and comparing a relative mass defect of the measured isotope peak to a calculated relative mass defect of the isotopic ion of the proposed empirical formula. The proposed empirical formula is identified as a potential candidate for the analyte ion based on these comparisons.
    Type: Grant
    Filed: November 4, 2005
    Date of Patent: December 9, 2008
    Assignee: Agilent Technologies, Inc.
    Inventors: Jerry A. Zweigenbaum, Earl M. Thurman, Imma Ferrer