Patents by Inventor Edmond Ward
Edmond Ward has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11672189Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: GrantFiled: March 8, 2021Date of Patent: June 6, 2023Assignee: Hefei Reliance Memory LimitedInventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, Jr., Lawrence Schloss, Philip Swab, Edmond Ward
-
Patent number: 11063214Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: GrantFiled: April 30, 2020Date of Patent: July 13, 2021Assignee: Hefei Reliance Memory LimitedInventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, Jr., Lawrence Schloss, Philip Swab, Edmond Ward
-
Publication number: 20210193917Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: ApplicationFiled: March 8, 2021Publication date: June 24, 2021Inventors: Darrell RINERSON, Christophe J. CHEVALLIER, Wayne KINNEY, Roy LAMBERTSON, John E. SANCHEZ, JR., Lawrence SCHLOSS, Philip SWAB, Edmond WARD
-
Publication number: 20200259079Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: ApplicationFiled: April 30, 2020Publication date: August 13, 2020Inventors: Darrell RINERSON, Christophe J. CHEVALLIER, Wayne KINNEY, Roy LAMBERTSON, John E. SANCHEZ, JR., Lawrence SCHLOSS, Philip SWAB, Edmond WARD
-
Patent number: 10680171Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: GrantFiled: January 30, 2019Date of Patent: June 9, 2020Assignee: Hefei Reliance Memory LimitedInventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, Jr., Lawrence Schloss, Philip Swab, Edmond Ward
-
Publication number: 20190173006Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: ApplicationFiled: January 30, 2019Publication date: June 6, 2019Inventors: Darrell RINERSON, Christophe J. CHEVALLIER, Wayne KINNEY, Roy LAMBERTSON, John E. SANCHEZ, JR., Lawrence SCHLOSS, Philip SWAB, Edmond WARD
-
Patent number: 10224480Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: GrantFiled: October 30, 2017Date of Patent: March 5, 2019Assignee: Hefei Reliance Memory LimitedInventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, Jr., Lawrence Schloss, Philip Swab, Edmond Ward
-
Publication number: 20180130946Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric filed to cause oxygen ionic motion.Type: ApplicationFiled: October 30, 2017Publication date: May 10, 2018Inventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, JR., Lawrence Schloss, Philip Swab, Edmond Ward
-
Patent number: 9831425Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric field effective to cause oxygen ionic motion.Type: GrantFiled: September 3, 2015Date of Patent: November 28, 2017Assignee: Unity Semiconductor CorporationInventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, Jr., Lawrence Schloss, Philip Swab, Edmond Ward
-
Publication number: 20150380642Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric field effective to cause oxygen ionic motion.Type: ApplicationFiled: September 3, 2015Publication date: December 31, 2015Inventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, JR., Lawrence Schloss, Philip Swab, Edmond Ward
-
Patent number: 9159913Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric field effective to cause oxygen ionic motion.Type: GrantFiled: August 19, 2014Date of Patent: October 13, 2015Assignee: Unity Semiconductor CorporationInventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, Jr., Lawrence Schloss, Philip Swab, Edmond Ward
-
Publication number: 20150029780Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric field effective to cause oxygen ionic motion.Type: ApplicationFiled: August 19, 2014Publication date: January 29, 2015Inventors: Darrell Rinerson, Christophe J. Chevallier, Wayne Kinney, Roy Lambertson, John E. Sanchez, JR., Lawrence Schloss, Philip Swab, Edmond Ward
-
Patent number: 8675389Abstract: A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3—LSCoO or LaNiO3—LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays.Type: GrantFiled: October 13, 2011Date of Patent: March 18, 2014Assignee: Unity Semiconductor CorporationInventors: Christophe Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, Darrell Rinerson, John Sanchez, Jr., Philip Swab, Edmond Ward
-
Patent number: 8611130Abstract: A treated conductive element is provided. A conductive element can be treated by depositing either a reactive metal or a very thin layer of material on the conductive element. The reactive metal (or very thin layer of material) would typically be sandwiched between the conductive element and an electrode. The structure additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays.Type: GrantFiled: November 21, 2011Date of Patent: December 17, 2013Assignee: Unity Semiconductor CorporationInventors: Darrell Rinerson, Christophe Chevallier, Steve Kuo-Ren Hsia, Wayne Kinney, Steven Longcor, John Sanchez, Jr., Philip Swab, Edmond Ward
-
Publication number: 20120087174Abstract: A memory using mixed valence conductive oxides is disclosed. The memory includes a mixed valence conductive oxide that is less conductive in its oxygen deficient state and a mixed electronic ionic conductor that is an electrolyte to oxygen and promotes an electric field effective to cause oxygen ionic motion.Type: ApplicationFiled: December 16, 2011Publication date: April 12, 2012Applicant: UNITY SEMICONDUCTOR CORPORATIONInventors: DARRELL RINERSON, CHRISTOPHE J. CHEVALLIER, WAYNE KINNEY, ROY LAMBERTSON, STEVEN W. LONGCOR, JOHN E. SANCHEZ, JR., LAWRENCE SCHLOSS, PHILIP F.S. SWAB, EDMOND WARD
-
Patent number: 8062942Abstract: A treated conductive element is provided. A conductive element can be treated by depositing either a reactive metal or a very thin layer of material on the conductive element. The reactive metal (or very thin layer of material) would typically be sandwiched between the conductive element and an electrode. The structure additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays.Type: GrantFiled: June 30, 2008Date of Patent: November 22, 2011Inventors: Darrell Rinerson, Wayne Kinney, Edmond Ward, Steve Kuo-Ren Hsia, Steven W. Longcor, Christophe J. Chevallier, John E. Sanchez, Jr., Philip Swab
-
Publication number: 20110278532Abstract: A memory using a tunnel barrier that has a variable effective width is disclosed. A memory element includes a tunneling barrier and a conductive material. The conductive material typically has mobile ions that either move towards or away from the tunneling barrier in response to a voltage across the memory element. A low conductivity region is either formed or destroyed. It can be formed by either the depletion or excess ions around the tunneling barrier, or by the mobile ions combining with complementary ions. It may be destroyed by either reversing the forming process or by reducing the tunneling barrier and injecting ions into the conductive material. The low conductivity region increases the effective width of the tunnel barrier, making electrons tunnel a greater distance, which reduces the memory element's conductivity. By varying conductivity multiple states can be created in the memory cell.Type: ApplicationFiled: July 26, 2011Publication date: November 17, 2011Applicant: UNITY SEMICONDUCTOR CORPORATIONInventors: DARRELL RINERSON, CHRISTOPHE CHEVALLIER, WAYNE KINNEY, EDMOND WARD
-
Patent number: 7985963Abstract: A memory using a tunnel barrier that has a variable effective width is disclosed. A memory element includes a tunneling barrier and a conductive material. The conductive material typically has mobile ions that either move towards or away from the tunneling barrier in response to a voltage across the memory element. A low conductivity region is either formed or destroyed. It can be formed by either the depletion or excess ions around the tunneling barrier, or by the mobile ions combining with complementary ions. It may be destroyed by either reversing the forming process or by reducing the tunneling barrier and injecting ions into the conductive material. The low conductivity region increases the effective width of the tunnel barrier, making electrons tunnel a greater distance, which reduces the memory element's conductivity. By varying conductivity multiple states can be created in the memory cell.Type: GrantFiled: May 21, 2009Date of Patent: July 26, 2011Inventors: Darrell Rinerson, Christophe Chevallier, Wayne Kinney, Edmond Ward
-
Patent number: 7889539Abstract: A memory cell including conductive oxide electrodes is disclosed. The memory cell includes a memory element operative to store data as a plurality of resistive states. The memory element includes a layer of a conductive metal oxide (CMO) (e.g., a perovskite) in contact with an electrode that may comprise one or more layers of material. At least one of those layers of material can be a conductive oxide (e.g., a perovskite such as LaSrCoO3-LSCoO or LaNiO3-LNO) that is in contact with the CMO. The conductive oxide layer can be selected as a seed layer operative to provide a good lattice match with and/or a lower crystallization temperature for the CMO. The conductive oxide layer may also be in contact with a metal layer (e.g., Pt). The memory cell additionally exhibits non-linear IV characteristics, which can be favorable in certain arrays, such as non-volatile two-terminal cross-point memory arrays.Type: GrantFiled: December 14, 2009Date of Patent: February 15, 2011Inventors: Darrell Rinerson, Wayne Kinney, Edmond Ward, Steve Kuo-Ren Hsia, Steven W. Longcor, Christophe Chevallier, John E. Sanchez, Jr., Philip Swab
-
Patent number: 7884349Abstract: A memory cell including a memory element and a non-ohmic device (NOD) that are electrically in series with each other is disclosed. The NOD comprises a semiconductor based selection device operative to electrically isolate the memory element from a range of voltages applied across the memory cell that are not read voltages operative read stored data from the memory element or write voltages operative to write data to the memory element. The selection device may comprise a pair of diodes that are electrically in series with each other and disposed in a back-to-back configuration. The memory cell may be fabricated over a substrate (e.g., a silicon wafer) that includes active circuitry. The selection device and the semiconductor materials (e.g., poly-silicon) that form the selection device are fabricated above the substrate and are integrated with other thin film layers of material that form the memory cell.Type: GrantFiled: September 11, 2008Date of Patent: February 8, 2011Inventors: Darrell Rinerson, Steve Kuo-Ren Hsia, Steven W. Longcor, Wayne Kinney, Edmond Ward, Christophe J. Chevallier