Patents by Inventor Eduardo Alvarez Gallestey

Eduardo Alvarez Gallestey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7933664
    Abstract: Modelling of industrial processes is simplified with the use of Mixed Logical Dynamic (MLD) framework. Optimal control problems can be generated for application to industrial processes. For example, two arbitrarily connected MLD blocks are automatically merged to obtain one composite MLD block. Via a repeated use of the procedure, any arbitrarily complex system containing the complete description of an industrial process can be generated from the simplest MLD building blocks. The optimal control problem is generated via adding an MLD block whose unique output becomes the cost functional of the problem. In a graphical environment, any specific industrial process may be reproduced by instantiating blocks from a library of basic MLD elements or atomic MLD blocks and by properly connecting them. In case an appropriate library is available, this process will not require any expert knowledge from the end user apart from the ability to build the graphical interconnections mentioned.
    Type: Grant
    Filed: December 4, 2006
    Date of Patent: April 26, 2011
    Assignee: ABB Research Ltd
    Inventors: Eduardo Alvarez Gallestey, Dario Castagnoli, Alec Stothert
  • Patent number: 7266416
    Abstract: The disclosed process control system makes use of Optimal control (OC) and model predictive control (MPC) techniques for selection of the Expert Systems (ES) targets values U. The ES target values U are selected to minimize the performance criterion J. A mathematical model of an extended system given by the process P and the ES is developed. This hybrid mathematical model has both continuous dynamics and logical relationships. Controlled variables of the mathematical model are the ES target values U and inputs are the measurements y and the performance criterion J. The OC and/or MPC techniques are used to compute values U. An optimizer of the OC/MPC selects values of the ES target values U only. This activity has lower sampling rates than selection of controller values, which simplifies the design of the OC/MPC controller.
    Type: Grant
    Filed: December 23, 2004
    Date of Patent: September 4, 2007
    Assignee: ABB Research Ltd
    Inventors: Eduardo Alvarez Gallestey, Alec Stothert
  • Publication number: 20040117045
    Abstract: In a method and a computer program product for designing a component for an industrial plant, in particular a thick-walled component for a power plant, by means of an iteration, in which the steps of
    Type: Application
    Filed: November 26, 2003
    Publication date: June 17, 2004
    Applicant: ABB Research Ltd
    Inventors: Geir Hovland, Eduardo Alvarez Gallestey, Alec Stothert, Steve Morton, Marc Antoine