Patents by Inventor Edward A. Klimek

Edward A. Klimek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6209452
    Abstract: The present invention is a ball marking template comprising first and second portions attached to each other at first ends respectively by a hinge mechanism, the first and second portions each further having two inwardly curving arms separated by a gap on second ends thereof, whereby when a golf ball is placed within the template, it may be marked by tracing along a peripheral edge of the gap. In an alternate embodiment, the ball marking template comprises first and second portions attached to each other by a curved portion, each of the first and second portions having a shaped aperture located at a distal end, respectively, whereby when a golf ball is placed within the template, it may be marked by tracing along a peripheral edge of the apertures.
    Type: Grant
    Filed: June 2, 1999
    Date of Patent: April 3, 2001
    Inventor: Edward A. Klimek
  • Patent number: 5925186
    Abstract: The present invention is a device for marking golf balls comprising a top portion with at least two apertures and a tube that is centrally located and perpendicularly attached, said tube also having a pair of oppositely located longitudinal slits therein, a bottom portion having at least two apertures and a post that is centrally located and perpendicularly attached, said post on the bottom portion being adapted to slideably fit within the tube located on the top portion, further, two projections on the post extend through the slits thereby limiting movement of the top portion relative to the bottom portion, additionally, the at least two apertures in the top portion are aligned with the at least two apertures in the bottom portion, whereby when a golf ball is placed between opposing apertures in the top portion and the bottom portion, a clamping pressure between the top and bottom portion secures the golf ball in place and the golf ball is then capable of being marked.
    Type: Grant
    Filed: September 22, 1998
    Date of Patent: July 20, 1999
    Inventor: Edward A. Klimek
  • Patent number: 5798835
    Abstract: A method and apparatus for interferometrically monitoring a target to determine, in accordance with predetermined criteria, an occurrence of a period of time that is optimum for obtaining a data point. In response to detecting such a period an impulse source, such as an impulse laser (14), is triggered to launch an elastic wave within the target so that a data point can be obtained.
    Type: Grant
    Filed: February 14, 1997
    Date of Patent: August 25, 1998
    Assignee: Textron Systems Corporation
    Inventors: Petros Amestis Kotidis, James Frederick Cunningham, Paul Fred Gozewski, Daniel Edward Klimek, Jaime A. Woodroffe
  • Patent number: 5793489
    Abstract: Disclosed herein is an interferometric-based materials analysis system (10) that employs a novel combination of laser beam shaping and pointing techniques, the use of a low cost, rugged, and compact diode laser (22) as a detection laser, and the use of signal processing techniques that compensate for inherent instabilities and short-term drift in the diode laser. A matched filter processing technique is disclosed for processing interferometrically-obtained data points from a target being analyzed. The matched filter technique is shown to be especially useful for detecting and analyzing Lamb modes within thin targets, such as a silicon wafer undergoing a rapid thermal processing cycle. Also disclosed is a method and apparatus for interferometrically monitoring a target to determine, in accordance with predetermined criteria, an occurrence of a period of time that is optimum for obtaining a data point.
    Type: Grant
    Filed: February 14, 1997
    Date of Patent: August 11, 1998
    Assignee: Textron System Corporation
    Inventors: Petros Amestis Kotidis, Paul Fred Gozewski, Charles Borsody, Daniel Edward Klimek, Jaime A. Woodroffe
  • Patent number: 5781304
    Abstract: Disclosed herein is an interferometric-based materials analysis system (10) that employs a novel combination of laser beam shaping and pointing techniques, the use of a low cost, rugged, and compact diode laser (22) as a detection laser, and the use of signal processing techniques that compensate for inherent instabilities and short-term drift in the diode laser. A matched filter processing technique is disclosed for processing interferometrically-obtained data points from a target being analyzed. The matched filter technique is shown to be especially useful for detecting and analyzing Lamb modes within thin targets, such as a silicon wafer undergoing a rapid thermal processing cycle.
    Type: Grant
    Filed: February 14, 1997
    Date of Patent: July 14, 1998
    Assignee: Textron Systems Corporation
    Inventors: Petros Amestis Kotidis, James Frederick Cunningham, Paul Fred Gozewski, Charles Borsody, Daniel Edward Klimek, Jaime A. Woodroffe