Abstract: A method and apparatus for determining out-of-plane defects in a paper sample are described. One embodiment of the method includes providing a paper sample, illuminating the sample with light, determining light scattering resulting from the light at a plurality of measuring regions, and determining an out-of-plane defect value by assigning the measuring regions to plural bands, calculating a standard deviation of light scattering for each of the bands, and averaging standard deviations of the bands. An alternative embodiment further includes assigning the measuring regions to plural columns of the sample, determining the out-of-plane defect value for each of the columns, and calculating the median of the out-of-plane defect values of the columns. The average out-of-plane defect value may also be calculated. One embodiment of the apparatus includes a housing for excluding ambient light and for holding a paper sample, a light source, and an image-capturing device.

Abstract: A method and apparatus for determining out-of-plane defects in a paper sample are described. One embodiment of the method includes providing a paper sample, illuminating the sample with light, determining light scattering resulting from the light at a plurality of measuring regions, and determining an out-of-plane defect value by assigning the measuring regions to plural bands, calculating a standard deviation of light scattering for each of the bands, and averaging standard deviations of the bands. An alternative embodiment further includes assigning the measuring regions to plural columns of the sample, determining the out-of-plane defect value for each of the columns, and calculating the median of the out-of-plane defect values of the columns. The average out-of-plane defect value may also be calculated. One embodiment of the apparatus includes a housing for excluding ambient light and for holding a paper sample, a light source, and an image-capturing device.