Patents by Inventor Edward Lambert Malantonio

Edward Lambert Malantonio has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probes for a wafer test apparatus
    Patent number: 7808260
    Abstract: A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (42), the foot defining a substantially flat surface configured to be connected to a substrate (400), a second end portion terminating in a tip (50), the tip being configured to contact an integrated circuit during testing of the integrated circuit, and a curved body portion (56) extending between the first end portion and the second end portion.
    Type: Grant
    Filed: February 16, 2006
    Date of Patent: October 5, 2010
    Assignee: Kulicke And Soffa Industries, Inc.
    Inventors: Lich Thanh Tran, Edward Lambert Malantonio, Edward T. Laurent, Ilan Hanoon, Dan Mironescu
  • Probes for a Wafer Test Apparatus
    Publication number: 20080258746
    Abstract: A probe configured for use in the testing of integrated circuits includes a first end portion terminating in a foot (42), the foot defining a substantially flat surface configured to be connected to a substrate (400), a second end portion terminating in a tip (50), the tip being configured to contact an integrated circuit during testing of the integrated circuit, and a curved body portion (56) extending between the first end portion and the second end portion.
    Type: Application
    Filed: February 16, 2006
    Publication date: October 23, 2008
    Inventors: Lich Thanh Tran, Edward Lambert Malantonio, Edward T. Laurent, Ilan Hanoon, Dan Mironescu