Abstract: A radiation detector comprising a semiconductor radiation sensing surface having N radiation sensing surface segments of equal size, each radiation sensing surface segment being connected to a respective sensor circuit that outputs one of N output analog signals in response to radiation of a first type impinging on the radiation sensing surface segment connected to the sensor circuit; and a signal processor arrangement having N signal processing circuits that each receive and process one of said N first analog signals, where N is an integer larger than 1.

Abstract: A radiation detector comprising a semiconductor radiation sensing surface having N radiation sensing surface segments of equal size, each radiation sensing surface segment being connected to a respective sensor circuit that outputs one of N output analog signals in response to radiation of a first type impinging on the radiation sensing surface segment connected to the sensor circuit; and a signal processor arrangement having N signal processing circuits that each receive and process one of said N first analog signals, where N is an integer larger than 1.

Abstract: A multi-radiation identification and dosimetry system and method that allows for monitoring of alpha, beta, and gamma radiation is disclosed. The system/method incorporates a segmented silicon drift detector (SSDD) that allows measurement of directly absorbed radiation in the semiconductor (betas, conversion electrons, Lx lines, and alphas) on one SSDD segment and radiation from a radiation scintillation detector (RSD) on multiple segments of the SSDD. With the anode side of the SSDD directed toward the radiation inspection surface (RIS), the SSDD+RSD stacked radiation detector collects radiation which is processed by a charge sensitive amplifier (CSA) and then processed by a time stamping differentiator (TSD). A computing control device (CCD) may be configured to collect the time stamp differentiation data from the various SSDD segments to permit the simultaneous discrimination of several types of radiation by and presentation of these radiation types and counts on a display monitor.

Abstract: A multi-radiation identification and dosimetry system and method that allows for monitoring of alpha, beta, and gamma radiation is disclosed. The system/method incorporates a segmented silicon drift detector (SSDD) that allows measurement of directly absorbed radiation in the semiconductor (betas, conversion electrons, Lx lines, and alphas) on one SSDD segment and radiation from a radiation scintillation detector (RSD) on multiple segments of the SSDD. With the anode side of the SSDD directed toward the radiation inspection surface (RIS), the SSDD+RSD stacked radiation detector collects radiation which is processed by a charge sensitive amplifier (CSA) and then processed by a time stamping differentiator (TSD). A computing control device (CCD) may be configured to collect the time stamp differentiation data from the various SSDD segments to permit the simultaneous discrimination of several types of radiation by and presentation of these radiation types and counts on a display monitor.