Patents by Inventor Edward Principe

Edward Principe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sparse sampling using a programmatically randomized signal modulating a carrier signal
    Patent number: 11721519
    Abstract: A method and a system are for sparse sampling utilizing a programmatically randomized signal for modulating a carrier signal. The system includes a compound sparse sampling pattern generator that generates at least one primary carrier signal, and at least one secondary signal. The at least one secondary signal modulates the at least one primary signal in a randomized fashion.
    Type: Grant
    Filed: August 5, 2021
    Date of Patent: August 8, 2023
    Assignee: SYNCHROTRON RESEARCH, INC.
    Inventors: Edward Principe, Andrew Stevens, Conan Weiland, Jeffrey Hagen, Brian Kempshall, Kirk Scammon, Zachery Russell, Shane Didona, Mathieu Therezien, Tomas McIntee
  • SPARSE SAMPLING USING A PROGRAMMATICALLY RANDOMIZED SIGNAL MODULATING A CARRIER SIGNAL
    Publication number: 20230037773
    Abstract: A method and a system are for sparse sampling utilizing a programmatically randomized signal for modulating a carrier signal. The system includes a compound sparse sampling pattern generator that generates at least one primary carrier signal, and at least one secondary signal. The at least one secondary signal modulates the at least one primary signal in a randomized fashion.
    Type: Application
    Filed: August 5, 2021
    Publication date: February 9, 2023
    Inventors: Edward Principe, Andrew Stevens, Conan Weiland, Jeffrey Hagen, Brian Kempshall, Kirk Scammon, Zachery Russell, Shane Didona, Mathieu Therezien, Tomas McIntee
  • High-density FIB-SEM tomography via real-time imaging
    Patent number: 8178838
    Abstract: A method and an apparatus are for three-dimensional tomographic image generation in a scanning electron microscope system. At least two longitudinal marks are provided on the top surface of the sample which include an angle therebetween. In consecutive image recordings, the positions of these marks are determined and are used to quantify the slice thickness removed between consecutive image recordings.
    Type: Grant
    Filed: May 28, 2010
    Date of Patent: May 15, 2012
    Assignee: Carl Zeiss NTS GmbH
    Inventor: Edward Principe
  • High-density FIB-SEM tomography via real-time imaging
    Publication number: 20100288925
    Abstract: A method and an apparatus are for three-dimensional tomographic image generation in a scanning electron microscope system. At least two longitudinal marks are provided on the top surface of the sample which include an angle therebetween. In consecutive image recordings, the positions of these marks are determined and are used to quantify the slice thickness removed between consecutive image recordings.
    Type: Application
    Filed: May 28, 2010
    Publication date: November 18, 2010
    Inventor: Edward Principe
  • High-density FIB-SEM tomography via real-time imaging
    Patent number: 7750293
    Abstract: A method and an apparatus are for three-dimensional tomographic image generation in a scanning electron microscope system. At least two longitudinal marks are provided on the top surface of the sample which include an angle therebetween. In consecutive image recordings, the positions of these marks are determined and are used to quantify the slice thickness removed between consecutive image recordings.
    Type: Grant
    Filed: December 6, 2007
    Date of Patent: July 6, 2010
    Assignee: Carl Zeiss NTS GmbH
    Inventor: Edward Principe
  • High-density fib-sem tomography via real-time imaging
    Publication number: 20080087822
    Abstract: A method and an apparatus are for three-dimensional tomographic image generation in a scanning electron microscope system. At least two longitudinal marks are provided on the top surface of the sample which include an angle therebetween. In consecutive image recordings, the positions of these marks are determined and are used to quantify the slice thickness removed between consecutive image recordings.
    Type: Application
    Filed: December 6, 2007
    Publication date: April 17, 2008
    Inventor: Edward Principe
  • Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy
    Patent number: 7312448
    Abstract: A method and an apparatus are for three-dimensional tomographic image generation in a scanning electron microscope system. At least two longitudinal marks are provided on the top surface of the sample which include an angle therebetween. In consecutive image recordings, the positions of these marks are determined and are used to quantify the slice thickness removed between consecutive image recordings.
    Type: Grant
    Filed: April 6, 2005
    Date of Patent: December 25, 2007
    Assignee: Carl Zeiss NTS GmbH
    Inventor: Edward Principe
  • Method and apparatus for quantitative three-dimensional reconstruction in scanning electron microscopy
    Publication number: 20060226359
    Abstract: A method and an apparatus are for three-dimensional tomographic image generation in a scanning electron microscope system. At least two longitudinal marks are provided on the top surface of the sample which include an angle therebetween. In consecutive image recordings, the positions of these marks are determined and are used to quantify the slice thickness removed between consecutive image recordings.
    Type: Application
    Filed: April 6, 2005
    Publication date: October 12, 2006
    Inventor: Edward Principe