Patents by Inventor Edward Y K Hew

Edward Y K Hew has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for testing transducer heads in magnetic storage systems
    Patent number: 6696832
    Abstract: An apparatus and associated testing method for identifying void heads in magnetic storage systems in which a first bit error rate is determined using data written at a first overshoot amount. A second bit error rate is determined using data written at a second rate current in a second overshoot amount. A physically damaged transducer head is identified based upon a comparison of the first bit error rate to the second bit error rate.
    Type: Grant
    Filed: September 30, 2002
    Date of Patent: February 24, 2004
    Assignee: Seagate Technology LLC
    Inventors: Victor W K Chew, Edward Y K Hew, David K L Loh, Myint Ngwe, Wong Hon Leong, Say Kwee Teck