Abstract: A ball bump grid array package includes dies on one surface of a printed wiring board (PWB) and an array of ball bumps on the other surface of the PWB. The die is interconnected with the ball bumps by bond wires, traces on the one surface of the PWB, vias through the PWB and traces on the other surface of the PWB. Various die encapsulation schemes are discussed. The PWB is formed of FR4, BT, teflon or polyimide, or ceramic materials. The die may be connected to the traces on the one surface of the PWB with solder balls, rather than with bond wires. Two or more dies may be disposed on the one surface of the PWB, within the plastic molded body. The ball bumps on the other surface of the PWB may be arranged in a multiple grid pitch array--ball bumps within a central area being on a first pitch, and ball bumps without the central area being on a second pitch which is a multiple of the first pitch.

Abstract: A flip chip substrate includes first and second conductive layers, and a dielectric layer interposed therebetween. Each conductive layer includes a repeating pattern of a group of I/O signal traces such as two I/O signal traces, followed by a wider power or ground trace. The I/O traces on one conductive layer lie atop or below power or ground traces on the other conductive layer. The wider power and ground traces provide shielding on either side of the I/O trace group, as well as above or below.

Abstract: Unsingulated dies on a wafer may be individually electronically selected using various "electronic mechanisms" on the wafer. Conductive lines extend on the wafer from the electronic mechanism to the individual dies. The conductive lines may be provided in sets of two or more, such as for providing discrete power and ground connections from the external equipment to the individual dies. Redundant conductive lines may be provided to ensure against "open" faults. Diode and/or fuses may also be provided in conjunction with the conductive lines to ensure against leakages and shorts. Redundant electronic selection mechanisms may also be provided.

Abstract: A first, lower heat sink disposed immediately below and closely adjacent a semiconductor chip (die) in a semiconductor chip assembly is disclosed. The lower heat sink is a flat metallic or ceramic shim. A second, upper heat sink disposed immediately above and closely adjacent the top surface of the semiconductor device is disclosed. The upper heat sink may have a portion in contact with a passivation layer over the top surface of the semiconductor die (device). The second heat sink preferably has a flat surface forming an exterior surface of the semiconductor device assembly. In one embodiment, the second heat sink has pedestals resting atop a plastic layer in a tape-like structure within the semiconductor chip assembly. In a second embodiment, the second heat sink includes an add-on portion that is external to the semiconductor chip assembly. The first heat sink is particularly well-suited to applications wherein the semiconductor chip assembly is mounted to a thermal mass.