Patents by Inventor Eiichi Tsunoda

Eiichi Tsunoda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6510725
    Abstract: A gage inspecting apparatus includes a jog dial 56A for controlling an amount of displacement of a measuring spindle 22 at a time when the position of the measuring spindle 22 is finely adjusted, and a shuttle ring 56B for controlling the driving direction and driving speed of the measuring spindle 22 at a time when the position of the measuring spindle 22 is roughly adjusted. The relationship between the amount of rotation of the jog dial 56A and the amount of displacement of the measuring spindle 22 can be set in correspondence with a scale interval of the gage.
    Type: Grant
    Filed: October 10, 2001
    Date of Patent: January 28, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Yuwu Zhang, Masaoki Yamagata, Yoichi Toida, Shiro Igasaki, Eiichi Tsunoda
  • Publication number: 20020046005
    Abstract: A gage inspecting apparatus includes a jog dial 56A for controlling an amount of displacement of a measuring spindle 22 at a time when the position of the measuring spindle 22 is finely adjusted, and a shuttle ring 56B for controlling the driving direction and driving speed of the measuring spindle 22 at a time when the position of the measuring spindle 22 is roughly adjusted. The relationship between the amount of rotation of the jog dial 56A and the amount of displacement of the measuring spindle 22 can be set in correspondence with a scale interval of the gage.
    Type: Application
    Filed: October 10, 2001
    Publication date: April 18, 2002
    Applicant: Mitutoyo Corporation
    Inventors: Yuwu Zhang, Masaoki Yamagata, Yoichi Toida, Shiro Igasaki, Eiichi Tsunoda
  • Patent number: 4630381
    Abstract: A coordinate measuring instrument wherein a measuring element is related to a work to be measured, and a configuration or the like of the work is measured from a displacement of this measuring element. In this measuring instrument, one of supports is supported by one of guide rails in a manner to be positionally adjustable in direction of X- and Z-axes and the other of the supports is supported in a manner to be displaceable only in a direction of one of the guide rails. A slider guide rail racked across the supports can be adjusted in its posture in the direction of X- and Z-axes by a posture adjusting mechanism provided on connecting portions between the slider rail and the supports. The slider guide rail thus adjusted in posture in non-displaceable in the moving direction of a slider in a state where adjustment members provided on the slider guide rail are closely abutted against abutting surfaces of the supports.
    Type: Grant
    Filed: July 10, 1985
    Date of Patent: December 23, 1986
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventors: Hideo Sakata, Eiichi Tsunoda
  • Patent number: 4567660
    Abstract: This disclosure depicts a clamp device in a measuring instrument wherein a slider having a detecting portion is clamped to a guide member, comprising: a holder provided on the slider and penetrated therethrough with the guide member; a movable block received in the holder and having a through-hole, through which the guide member extends; a screw member threadably coupled into the movable block; and a rotation locking mechanism for locking the movable block. Rotation of the screw member causes the forward end face thereof to contact the guide member, so that the slider can be clamped.
    Type: Grant
    Filed: October 4, 1984
    Date of Patent: February 4, 1986
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventors: Hideo Sakata, Eiichi Tsunoda