Patents by Inventor Ellis S. Waldman

Ellis S. Waldman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and methods for thickness and velocity measurement of flat moving materials using high frequency radar technologies
    Patent number: 11340343
    Abstract: An apparatus and associated methods for measuring thickness and velocity of flat moving materials utilizing high frequency radar technologies. Two identical radar-based systems for measuring absolute distances between the source of the radar-generated electromagnetic wave and each surface of a flat sheet material is used to determine the thickness of that material as a relative distance. A pair of high frequency radars situated at different locations used to measure the delay time between the occurrences of fingerprint-like unevenness on the moving flat sheet of material to determine the linear velocity of the moving material sheet.
    Type: Grant
    Filed: March 23, 2018
    Date of Patent: May 24, 2022
    Assignee: DOLPHIN MEASUREMENT SYSTEMS, LLC
    Inventors: Ellis S. Waldman, Alexander M. Raykhman, Boris Sherman
  • APPARATUS AND METHODS FOR THICKNESS AND VELOCITY MEASUREMENT OF FLAT MOVING MATERIALS USING HIGH FREQUENCY RADAR TECHNOLOGIES
    Publication number: 20200292689
    Abstract: An apparatus and associated methods for measuring thickness and velocity of flat moving materials utilizing high frequency radar technologies. Two identical radar-based systems for measuring absolute distances between the source of the radar-generated electromagnetic wave and each surface of a flat sheet material is used to determine the thickness of that material as a relative distance. A pair of high frequency radars situated at different locations used to measure the delay time between the occurrences of fingerprint-like unevenness on the moving flat sheet of material to determine the linear velocity of the moving material sheet.
    Type: Application
    Filed: March 23, 2018
    Publication date: September 17, 2020
    Applicant: Dolphin Measurement System, LLC
    Inventors: Ellis S. Waldman, Alexander M. Ray kh man, Boris Sherman
  • Method and system for measurement of parameters of a flat material
    Patent number: 8174258
    Abstract: A system and method for measurement of parameters of a conductive material, include generating an oscillating electromagnetic field (EMF) interacting with a sample portion from a remotely positioned source; measuring values of components of impedance of the electromagnetic; populating a system of equations including a theory of electromagnetism-based mathematical model of the electromagnetic system; solving the system of equations to calculate values of a distance between the sample portion and the source, thickness of the sample portion in proximity to a point of projection of the source onto the sample portion and electromagnetic properties of the sample portion; outputting the calculated values as the measured values; and repeating the steps of generating, populating, solving, outputting and repeating using the calculated values for the step of populating in place of the measured component values.
    Type: Grant
    Filed: April 20, 2009
    Date of Patent: May 8, 2012
    Assignee: Dolphin Measurement Systems LLC
    Inventors: Alexander M. Raykhman, Eugene Naidis, Ellis S. Waldman
  • METHOD AND SYSTEM FOR MEASUREMENT OF PARAMETERS OF A FLAT MATERIAL
    Publication number: 20090281764
    Abstract: A system and method for measurement of parameters of a conductive material, include generating an oscillating electromagnetic field (EMF) interacting with a sample portion from a remotely positioned source; measuring values of components of impedance of the electromagnetic; populating a system of equations including a theory of electromagnetism-based mathematical model of the electromagnetic system; solving the system of equations to calculate values of a distance between the sample portion and the source, thickness of the sample portion in proximity to a point of projection of the source onto the sample portion and electromagnetic properties of the sample portion; outputting the calculated values as the measured values; and repeating the steps of generating, populating, solving, outputting and repeating using the calculated values for the step of populating in place of the measured component values.
    Type: Application
    Filed: April 20, 2009
    Publication date: November 12, 2009
    Inventors: Alexander M. Raykhman, Ellis S. Waldman, Eugene Naidis