Abstract: System and method for measurement of optical parameters and characterization of multiport optical devices constituted by process control systems, one or more sources of optical test signal (11) (tunable laser source), optical circuit including optical fiber and several other optical components arranged so as to constitute an interferometric optical arrangement, optical connectors, optoeletronic interfaces, photodetectors, analogical electronic; circuits, digital electronic circuits for digital signal processing and electronic circuits for data acquisition, the test and reference optical signals traversing paths with any lengths, that can be identical or distinct, the optical signal traversing at least one of said paths of interferometer being phase- and/or frequency-modulated.