Patents by Inventor Emilio Miguelanez

Emilio Miguelanez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for hybrid outlier detection
    Patent number: 8788237
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: March 29, 2013
    Date of Patent: July 22, 2014
    Assignee: Test Acuity Solutions
    Inventors: Emilio Miguelanez, Greg LaBonte
  • Methods and apparatus for hybrid outlier detection
    Patent number: 8606536
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: December 10, 2013
    Assignee: Test Acuity Solutions, Inc.
    Inventors: Emilio Miguelanez, Greg I. LaBonte
  • Methods and apparatus for local outlier detection
    Patent number: 8417477
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.
    Type: Grant
    Filed: May 20, 2005
    Date of Patent: April 9, 2013
    Assignee: Test Acuity Solutions, Inc.
    Inventors: Emilio Miguelanez, Jacky Gorin, Eric Paul Tabor
  • Methods and apparatus for data analysis
    Patent number: 8041541
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
    Type: Grant
    Filed: March 27, 2007
    Date of Patent: October 18, 2011
    Assignee: Test Advantage, Inc.
    Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala
  • Methods and apparatus for data analysis
    Patent number: 7904279
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
    Type: Grant
    Filed: September 19, 2007
    Date of Patent: March 8, 2011
    Assignee: Test Advantage, Inc.
    Inventors: Emilio Miguelanez, Michael J. Scott, Greg LaBonte
  • METHODS AND APPARATUS FOR DATA ANALYSIS
    Publication number: 20100088054
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
    Type: Application
    Filed: October 5, 2009
    Publication date: April 8, 2010
    Inventors: EMILIO MIGUELANEZ, MICHAEL J. SCOTT, JACKY GORIN, PAUL BUXTON, ERIC PAUL TABOR
  • METHODS AND APPARATUS FOR HYBRID OUTLIER DETECTION
    Publication number: 20100036637
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Application
    Filed: October 15, 2009
    Publication date: February 11, 2010
    Inventors: Emilio Miguelanez, Greg I. LaBonte
  • METHODS AND APPARATUS FOR DATA ANALYSIS
    Publication number: 20080189575
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
    Type: Application
    Filed: January 29, 2008
    Publication date: August 7, 2008
    Inventors: EMILIO MIGUELANEZ, Michael J. Scotl, Jacky Gorin, Paul Buxton, Paul Tabor
  • METHODS AND APPARATUS FOR DATA ANALYSIS
    Publication number: 20080091977
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
    Type: Application
    Filed: September 19, 2007
    Publication date: April 17, 2008
    Inventors: Emilio Miguelanez, Michael Scott, Greg LaBonte
  • Methods and apparatus for data analysis
    Patent number: 7356430
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: February 7, 2005
    Date of Patent: April 8, 2008
    Assignee: Test Advantage, Inc.
    Inventors: Emilio Miguelanez, Michael J. Scott, Jacky Gorin, Paul Buxton, Paul Tabor
  • METHODS AND APPARATUS FOR HYBRID OUTLIER DETECTION
    Publication number: 20070219741
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations.
    Type: Application
    Filed: September 27, 2006
    Publication date: September 20, 2007
    Inventors: Emilio Miguelanez, Greg LaBonte
  • Methods and apparatus for data analysis
    Patent number: 7225107
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
    Type: Grant
    Filed: December 7, 2003
    Date of Patent: May 29, 2007
    Assignee: Test Advantage, Inc.
    Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala
  • Methods and apparatus for local outlier detection
    Publication number: 20060085155
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.
    Type: Application
    Filed: May 20, 2005
    Publication date: April 20, 2006
    Inventors: Emilio Miguelanez, Jacky Gorin, Eric Tabor
  • Methods and apparatus for data analysis
    Publication number: 20050278597
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
    Type: Application
    Filed: February 7, 2005
    Publication date: December 15, 2005
    Inventors: Emilio Miguelanez, Michael Scott, Jacky Gorin, Paul Buxton, Paul Tabor
  • Methods and apparatus for data analysis
    Publication number: 20040138846
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a fabrication process for components based on test data for the components.
    Type: Application
    Filed: December 7, 2003
    Publication date: July 15, 2004
    Inventors: Paul M. Buxton, Eric Paul Tabor, Emilio Miguelanez Martin, Ali M. S. Zalzala