Patents by Inventor Emmanuel Jean-Marc Beaurepaire

Emmanuel Jean-Marc Beaurepaire has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9791682
    Abstract: A nonlinear optical microscope is provided, including source of a pulsed laser beam; a spatial light modulator for modulating the spatial profile of the pulsed laser beam; an objective for guiding the modulated beam towards a slide intended to carry a specimen; and a detector for collecting signals originating from the specimen, wherein the spatial light modulator is designed to modulate the intensity and/or the phase of the pulsed laser beam on the rear pupil of the objective to produce a beam that is axially extended and confined in one or two lateral directions after focusing by the objective, and wherein the slide is placed on a motorized stage of a histology slide scanner assembly.
    Type: Grant
    Filed: December 3, 2012
    Date of Patent: October 17, 2017
    Assignees: ECOLE POLYTECHNIQUE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Marie-Claire Schanne-Klein, Emmanuel Jean-Marc Beaurepaire, Mathias Strupler, Delphine Debarre, Nicolas Olivier, Pierre Mahou
  • Publication number: 20140367591
    Abstract: A module is provided for a multi-photon imaging system for simultaneously exciting chromophores of a specimen. A first femtosecond laser source emits a first pulsed excitation beam having a repetition rate 1/T and a wavelength ?1 exciting a first chromophores, the absorbed photons originating from the first excitation beam. A second femtosecond laser source emits a second pulsed excitation beam with a wavelength ?2 exciting a second chromophores, the absorbed photons originating from the second beam; the first beam including an “excitation” part exciting the specimen and a “pumping” part acting as a pump beam for exciting the second laser source to synchronize the second laser source with the first laser source. An optical delay line superimposes spatially and temporally the second beam and the excitation part of the first beam to excite at least a third chromophore, the absorbed photons originating from the first and second excitation beams.
    Type: Application
    Filed: February 1, 2013
    Publication date: December 18, 2014
    Inventors: Pierre Mahou, Emmanuel Jean Marc Beaurepaire, Delphine Debarre, Willy Supatto, Jean Louis Martin
  • Publication number: 20140347462
    Abstract: A nonlinear optical microscope is provided, including source of a pulsed laser beam; a spatial light modulator for modulating the spatial profile of the pulsed laser beam; an objective for guiding the modulated beam towards a slide intended to carry a specimen; and a detector for collecting signals originating from the specimen, wherein the spatial light modulator is designed to modulate the intensity and/or the phase of the pulsed laser beam on the rear pupil of the objective to produce a beam that is axially extended and confined in one or two lateral directions after focusing by the objective, and wherein the slide is placed on a motorized stage of a histology slide scanner assembly.
    Type: Application
    Filed: December 3, 2012
    Publication date: November 27, 2014
    Applicants: ECOLEE POLYECHNIQUE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Marie-Claire Schanne-Klein, Emmanuel Jean-Marc Beaurepaire, Mathias Strupler, Delphine Debarre, Nicolas Olivier, Pierre Mahou
  • Patent number: 8284483
    Abstract: A method for acquiring signals in laser scanning microscopy, includes the steps of: moving a focused optical excitation beam relative to an object to be measured so that the focus point of the beam follows a predetermined path in the space of the object; and acquiring optical measurement signals along the path according to at least one acquisition parameter; characterized in that the path of the excitation beam is determined so as to substantially minimize the variations of the optical properties of at least one portion of the environments crossed by the excitation beam between consecutive acquisitions, and in that at least one acquisition parameter among the acquisition parameters is modulated during the movement of the excitation beam. A device for implementing the method is also described.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: October 9, 2012
    Assignee: Ecole Polytechnique
    Inventors: Emmanuel Jean-Marc Beaurepaire, Israel Veilleux, Nicolas Olivier, Delphine Malvina Daniele Marie Debarre, Jean-Louis Martin
  • Patent number: 8227767
    Abstract: A method for the dimensional characterization of a structured material, in which method: an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of the structured material are deduced therefrom.
    Type: Grant
    Filed: June 26, 2009
    Date of Patent: July 24, 2012
    Assignee: Ecole Polytechnique
    Inventors: Emmanuel Jean-Marc Beaurepaire, Nicolas Olivier, Delphine Debarre, Marie-Claire Schanne-Klein, Jean-Louis Martin
  • Publication number: 20110296562
    Abstract: A method for acquiring signals in laser scanning microscopy, includes the steps of: moving a focused optical excitation beam relative to an object to be measured so that the focus point of the beam follows a predetermined path in the space of the object; and acquiring optical measurement signals along the path according to at least one acquisition parameter; characterised in that the path of the excitation beam is determined so as to substantially minimise the variations of the optical properties of at least one portion of the environments crossed by the excitation beam between consecutive acquisitions, and in that at least one acquisition parameter among the acquisition parameters is modulated during the movement of the excitation beam. A device for implementing the method is also described.
    Type: Application
    Filed: February 3, 2010
    Publication date: December 1, 2011
    Applicant: ECOLE POLYTECHNIQUE
    Inventors: Emmanuel Jean-Marc Beaurepaire, Israël Veilleux, Nicolas Olivier, Delphine Malvina Danièle Marie Debarre, Jean-Louis Martin
  • Publication number: 20110147616
    Abstract: A method for the dimensional characterization of a structured material, in which method: an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of the structured material are deduced therefrom.
    Type: Application
    Filed: June 26, 2009
    Publication date: June 23, 2011
    Applicant: ECOLE POLYTECHNIQUE
    Inventors: Emmanuel Jean-Marc Beaurepaire, Nicolas Olivier, Delphine Debarre, Marie-Claire Schanne-Klein, Jean-Louis Martin