Abstract: A memory device is provided that includes a memory controller coupled to a memory array. The memory controller is adapted to perform a closed loop training interval and perform an open loop programming interval. The closed loop training interval determines a corresponding first state successful voltage and a corresponding second state successful voltage for a first group of memory cells each including a barrier modulated switching structure. The open loop programming interval programs a second group of memory cells each including a barrier modulated switching structure to a first state and a second state using the corresponding first state successful voltage and the corresponding second state successful voltage, respectively.

Abstract: A memory device is provided that includes a memory controller coupled to a memory array. The memory controller is adapted to perform a closed loop training interval and perform an open loop programming interval. The closed loop training interval determines a corresponding first state successful voltage and a corresponding second state successful voltage for a first group of memory cells each including a barrier modulated switching structure. The open loop programming interval programs a second group of memory cells each including a barrier modulated switching structure to a first state and a second state using the corresponding first state successful voltage and the corresponding second state successful voltage, respectively.

Abstract: A memory device is provided that includes a memory array having a plurality of reversible resistance-switching memory cells, and a memory controller coupled to the memory array. The memory controller is adapted to program a first reversible resistance-switching memory cell in the memory array to a predetermined data state, determine a program loop count associated with the program step, and retire the first reversible resistance-switching memory cell from further use for host data storage based on the associated program loop count.

Abstract: A memory device is provided that includes a memory controller coupled to a memory cell including a barrier modulated switching structure. The memory controller is adapted to program the memory cell to a first programming state, and program the memory cell to one of a plurality of target programming states from the first programming state.

Abstract: Examples include a method of programming resistive random access memory (RRAM) array for analog computations. In some examples, a selected RRAM cell of the RRAM array may be programmed with a selected target conductance and a programmed conductance error of the selected RRAM cell may be determined. A neighboring RRAM cell may be programmed with an error corrected target conductance that is a function of a neighboring target conductance and the programmed conductance error of the selected RRAM cell. The neighboring RRAM cell may be in a same row or a same column as the selected RRAM cell. The selected RRAM cell and neighboring RRAM cell are programmed such that the RRAM array is programmed for an analog computation.