Patents by Inventor Emory R. Walton, Jr.

Emory R. Walton, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process for making a probe for high speed integrated circuits
    Patent number: 4566184
    Abstract: A miniaturized probe is provided for making contact with test probe pads on an integrated circuit. The probe tips are precisely positioned on the underside of a microwave substrate board. Short wires extend through a hole in the insulating board and connect the probe tips to a conductive line on the topside of the microwave substrate board. The wires are imbedded in a potting compound which also holds the probe tips. Precise location of the probe tips is accomplished during fabrication of the probe by using depressions etched in a substrate as a mold and depositing metal in these depressions using photoresist and deposition techniques.
    Type: Grant
    Filed: November 19, 1984
    Date of Patent: January 28, 1986
    Assignee: Rockwell International Corporation
    Inventors: J. Aiden Higgins, Emory R. Walton, Jr.