Abstract: A system and methods for queuing processing jobs. The system is configured to receive a processing job associated with a user; score the processing job; apply one or more bounds; add the processing job to a queue; order the queue based on scores of processing jobs in the queue; and sample processing jobs from the queue for dispatch for processing. Sampling the jobs from the queues can comprise updating scores, updating application of bounds, and updating ordering of the queue; reading a batch of processing jobs from a top of the queue; attempting to dispatch the processing jobs of the batch for processing; removing from the queue any dispatched processing jobs; increasing the batch size by a constant factor; determining whether a maximum batch size is reached, or all processing jobs in the queue were in the batch.

Abstract: An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.

Abstract: An apparatus and methods of inspecting, analyzing, classifying, and/or grading quality of a transparent sheet using a data set of photoelasticity measurements, thickness measurements, segmentation specifications, measurement specifications and quality control specifications of the transparent sheet. A results measurement is calculated on a computing system, quality control specifications are applied to the results measurement allowing writing to the database and creating reports, sending results to an operator interface and machine control.

Abstract: This present invention relates to an apparatus and method for measuring the profile and reflective optical power of one or more surfaces of transparent sheets and transmissive optical power and thickness of one or more transparent sheets at a plurality of locations over the complete transparent sheet. The measurement results are presented to a user graphically and all data is stored for further processing, process control, and quality assurance.

Abstract: A hemispherical scanning optical scatterometer and method for its use for measuring scattered radiation, with a reflected scatter measurement laser, and/or a transmitted scatter measurement laser, an array of optical detectors, a computer controlled system to rotate the array of optical detectors, an electronic system, a computer interface and a computer for processing the signal.

Abstract: A method and apparatus for controlling the process used in the heat treatment of glass measures the quality of the glass following the heat treatment process. Inputs to the control system for the heat treatment process derive from the automated inspection of glass following heat treatment. Outputs from the control system for the heat treatment process may adjust one or more parameters in the heat treatment process including a furnace or heating setting, a transport setting, and a quench or cooling setting.

Abstract: A method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets are disclosed. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass and uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass and reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency and measures distortion in all axes.

Abstract: The invention is related to a method and apparatus for detecting and measuring the optical distortion in pieces of glass and other reflective sheets. The method inspects the full length and width of large area glass sheets or multiple sheets comprising a load of glass. The inspection method uses optical magnification of a reflected circular image of precise size. A plurality of circular images is projected onto the glass as it moves through the apparatus. The projected circles reflect as ellipsoids representative of local surface contours. The major and minor axes of the reflected axis define the axis of greatest magnification and demagnification. Distortions in the glass surface are measured in lens power as localized magnification at the elliptical axis. The angle and magnitude of the minor and major axis of the reflected ellipsoids provide data to map the surface profile of the glass. The method measures distortion of random or periodic frequency. The method measures distortion in all axes.